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http://dx.doi.org/10.5909/JBE.2017.22.3.350

PVD Image Steganography with Locally-fixed Number of Embedding Bits  

Kim, Jaeyoung (Pukyoung National University, Department of Electronic Engineering)
Park, Hanhoon (Pukyoung National University, Department of Electronic Engineering)
Park, Jong-Il (Hanyang University, Department of Computer and Software)
Publication Information
Journal of Broadcast Engineering / v.22, no.3, 2017 , pp. 350-365 More about this Journal
Abstract
Steganography is a technique for secret data communication, which is not perceived by third person between a receiver and a transmitter. It has been developed for thousands of years for the transmission of military, diplomatic or business information. The development of digital media and communication has led to the development of steganography techniques in modern times. Technic of image steganography include the LSB, which fixes the number of embedded bits into a pixel, and PVD, which exploits the difference value in the neighboring pixel pairs. In the case of PVD image steganography, a large amount of information is embedded fluidly by difference value in neighboring pixel pairs and the designed range table. However, since the secret information in order is embedded, if an error of the number of embedded bits occurs in a certain pixel pair, all subsequent information will be destroyed. In this paper, we proposes the method, which improve the vulnerability of PVD property about external attack or various noise and extract secret information. Experimental process is comparison analysis about stego-image, which embedded various noise. PVD shows that it is not possible to preserve secret information at all about noise, but it was possible to robustly extract secret information for partial noise of stego-image in case of the proposed PVD image steganography with locally-fixed number of embedding bits.
Keywords
Image steganography; pixel-value differencing; locally-fixed bits; robust extraction;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
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