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http://dx.doi.org/10.7779/JKSNT.2016.36.4.266

Propagation of Bulk Longitudinal Waves in Thin Films Using Laser Ultrasonics  

Kim, Yun Young (Department of Mechanical Engineering, Dong-eui University)
Publication Information
Journal of the Korean Society for Nondestructive Testing / v.36, no.4, 2016 , pp. 266-272 More about this Journal
Abstract
This paper presents the investigation of the propagation behavior of bulk longitudinal waves generated by an ultrafast laser system in thin films. A train of femtosecond laser pulses was focused onto the surface of a 150-nm thick metallic (chromium or aluminum) film on a silicon substrate to excite elastic waves, and the change in thermoreflectance at the spot was monitored to detect the arrival of echoes from the film/substrate interface. The experimental results show that the film material characteristics such as the wave velocity and Young's modulus can be evaluated through curve-fitting in numerical solutions. The material properties of nanoscale thin films are difficult to measure using conventional techniques. Therefore, this research provides an effective method for the nondestructive characterization of nanomaterials.
Keywords
Laser Ultrasonics; Longitudinal Bulk Wave; Thin Film; Characterization of Nanomaterials;
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Times Cited By KSCI : 2  (Citation Analysis)
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