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http://dx.doi.org/10.7779/JKSNT.2015.35.5.314

A Femtosecond Laser Metrology on the Thermal Conductivity of a Nanoscale Superconductor Material  

Kim, Yun Young (Department of Mechanical Engineering, Dong-eui University)
Publication Information
Journal of the Korean Society for Nondestructive Testing / v.35, no.5, 2015 , pp. 314-320 More about this Journal
Abstract
The present study investigates the thermal characteristics of a nanoscale superconductor material. A thin-film of $YBa_2Cu_3O_7-x$ was deposited on a $SrTiO_3$ substrate by using a pulsed-laser deposition technique and characterized using an ultrafast laser system. In order to extract a thermal conductivity value, a numerical solution for a transient one-dimensional heat conduction equation was obtained using a finite-difference method. The curve-fit shows a value 1.2 W/mK, which is relatively lower than those of bulk materials. This research provides a material property of superconductor thin-film required for the thermal design of micro or nanodevices.
Keywords
Ultrafast Laser Metrology; Thermal Conductivity; Superconductor; Thin-Film;
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