1 |
N. Kim, H. S. Nah and S. S. Lee, "Characterization of material degradation in epoxy film based on scanning acoustic microscopy (SAM)," Key Engineering Materials, Vol. 321-323, pp. 578-581 (2006)
DOI
|
2 |
N. Kim and B. Moon, "A new technique for ultrasonic thickness measurement of thin film," Japan and Korea Joint Workshop on Advanced Semiconductor Processing and Equipments, pp. 136-141, Hakone, Japan (2003)
|
3 |
V. K. Kinra and V. Dayal, "A new technique of ultrasonic nondestructive evaluation of thin specimens," Experimental Mechanics, Vol. 28, No. 3, pp. 288-297 (1988)
DOI
|
4 |
V. K. Kinra and V. R. Iyer, "Ultrasonic measurement of the thickness, phase velocity, density or attenuation of a thin viscoelastic plate. Part I: the forward problem," Ultrasonics, Vol. 33, No. 2, pp. 95-109 (1995)
DOI
ScienceOn
|
5 |
H. Nah, N. Kim, K.-J. Kwon and Y.-C. Song, "Experimental evaluation on degradation characteristics of epoxy coating by using adhesion force and impedance," Experimental Mechanics, Vol. 7, No. 2, pp. 149-158 (2003)
|
6 |
N. Kim and H. Nah, "Ultrasonic evaluation of epoxy coating in nuclear power plant," Material Science Forum, Vol. 449-452, pp. 1209-1212 (2004)
DOI
|
7 |
M. Frigione and A. Maffezzoli, "Nondestructive and in-situ monitoring of mechanical property buildup in epoxy adhesives for civil applications by propagation of ultrasonic waves," Ploymer Engineering and Science, Vol. 40, No. 3, pp. 656-664 (2000)
DOI
ScienceOn
|