Browse > Article

Microscopy Infrared Thermography Systems and Applications  

Park, Heesang (KRISS)
Choi, Manyong (KRISS)
Lee, Jaejung (KRISS)
Bremond, Pierre (FLIR)
Publication Information
Keywords
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. Isenberg and W. Warta "Spatially resolved evaluation of power losses in industrial solar cells by illuminated lock-in thermography," Progress in Photovoltaics: Research and Applications, Vol. 12, Issue 5, pp. 339-353 (2004)   DOI   ScienceOn
2 O. Breitenstein, J. P. Rakotoniaina, M. H. Al Rifai and M. Werner "Shunt types in crystalline silicon solar cells," Progress in Photovoltaics: Research and Applications, Vol. 12, Issue 7, pp. 529-538 (2004)   DOI   ScienceOn
3 M. Ashauer, J. Ende, H. Glosch, H. Haffner and K. Hiltmann, "Thermal characterization of microsystems by means of high-resolution thermography," Microelectronics Journal, Vol. 28, Issue 3, pp. 327-335 (1997)   DOI   ScienceOn
4 R. K. Lehtiniemi, "Bibliography of the application of infrared thermography to electronics," Proc. SPIE 3700, Thermosense XXI, 202 ; doi:10.1117/12.342323 (1999)   DOI
5 S. Dhokkar, B. Serio, P. Lagonotte and P. Meyrueis, "Power transistor near-infrared microthermography using an intensified CCD camera and frame integration," Measurement Science and Technology, Vol. 18, Num. 8, pp. 2696-2703 (2007)   DOI   ScienceOn
6 M. P. Luong, "Infrared thermographic scanning of fatigue in metals," Nuclear Engineering and Design, Vol. 158, Issues 2-3, pp. 363-376 (1995)   DOI   ScienceOn
7 T. Hierl, O. Schreer, J. Zettner, W. Gross and M. J. Schulz, "Thermal infrared microscopy (TIM) with sub-10-$\mu{m}$ spatial resolution," Proc. SPIE 3698, Infrared Technology and Applications XXV, 446; doi: 0.1117/12.354546 (1999)   DOI
8 D. Wu, and G. Busse, "Lock-in thermography for nondestructive evaluation of materials," Rev. Gen. Therm., Vol. 37, pp. 693-703 (1998)   DOI   ScienceOn