MnO2 as an Effective Sintering Aid for Enhancing Piezoelectric Properties of (K,Na)NbO3 Ceramics |
Jeong, Seong-Kyu
(School of Materials Science and Engineering, University of Ulsan)
Hong, In-Ki (School of Materials Science and Engineering, University of Ulsan) Do, Nam-Binh (School of Materials Science and Engineering, University of Ulsan) Tran, Vu Diem Ngoc (School of Materials Science and Engineering, University of Ulsan) Cho, Seong-Youl (R&D Center, LHE Corp.) Taib, Weon Pil (Ulsan Fine Chemical Industry Center, Ulsan Technopark) Lee, Jae-Shin (School of Materials Science and Engineering, University of Ulsan) |
1 | R. Shannon: Acta. Cryst., 32 (1976) 751. DOI |
2 | PCPDF card number 75-2159. |
3 | PCPDF card number 31-1051. |
4 | L. X. He and C. E. Li: J. Mat. Sci., 35 (2000) 2477. DOI ScienceOn |
5 | G. H. Haerting: J. Am. Ceram. Soc., 50 (1967) 229. |
6 | R. E. Jaeger and L. Egerton: J. Am. Ceram. Soc., 45 (1962) 209. DOI |
7 | Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya and M. Nakamura: Nature, 432 (2004) 84. DOI ScienceOn |
8 | B. Jaffe, W. R. Cook and H. Jaffe: Piezoelectric Ceramics. Academic Press, New York (1971). |
9 | L. Egerton and D. M. Dillon: J. Am. Ceram. Soc., 42 (1959) 438. DOI |
10 | L. E. Cross: Nature, 181 (1958) 178. DOI |
11 | D. Lin, K. W. Kwok and H. L. W. Chan: J. Appl. Phys. Lett, 9 (2007) 232903. |
12 | N. M. Hagh, K. Kerman, B. Jadidian and A. Safari: J. Eur. Cerm. Soc., 29 (2009) 2325. DOI ScienceOn |
13 | M. Jiang, X. Li, J. Liu, J. Zhu, X. Zhu and L. Li: J. Alloy. and Comp., 479 (2009) 18. DOI ScienceOn |
14 | J. Hao, Z. Xua, R. Chu, Y. Zhang, G. Li and Q. Yin: Mater. Chem. and Phys., 118 (2009) 229. DOI ScienceOn |
15 | D. Lin, K.W. Kwok and H. L. W. Chan: J. Alloy. and Comp., 461 (2008) 273. DOI ScienceOn |
16 | D. Lin, M. S. Guo, K. H. Lam, K. W. Kwok and H. L. W. Chan: J. Smart. Mat. Struct., 17 (2008) 035002. DOI ScienceOn |
17 | B. C. Park, I. K. Hong, H. D. Jang, V. D. N. Tran, W. P. Tai and J. S. Lee: Mater. Lett., 64 (2010) 1577. DOI ScienceOn |
18 | ANSI/IEEE Standard No. 176-1987. New York (1987). |