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http://dx.doi.org/10.4150/KPMI.2007.14.3.157

Principle and Applications of EELS Spectroscopy in Material Characterizations  

Yoon, Sang-Won (Advanced Analysis Center, Korea Institute of Science and Technology)
Kim, Kyou-Hyun (Advanced Analysis Center, Korea Institute of Science and Technology)
Ahn, Jae-Pyoung (Advanced Analysis Center, Korea Institute of Science and Technology)
Park, Jong-Ku (NanoScience Research Division, Korea Institute of Science and Technology)
Publication Information
Journal of Powder Materials / v.14, no.3, 2007 , pp. 157-164 More about this Journal
Abstract
An electron energy loss spectroscopy (EELS) instrument attached on transmission electron microscopy (TEM) becomes a powerful and analytical tool for extracting the noble information of materials using the enhancement of TEM images, elemental analysis, elemental or chemical mapping images, electron energy loss near edge structure (ELNES), and extended energy-loss fine structure (EXELFS). In this review, the principle and applications of EELS which is widely used in material, life, and electronic sciences were introduced.
Keywords
EELS; TEM; EFTEM; Ionization edge; ELNES; EXELFS;
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  • Reference
1 N. Bonnet, C. Colliex, C. Mory, M. Tence, Scan Microscopy 2 (1988) 351
2 N. Bonnet, J. M. Zahm: Cytometry 31 (1998) 217   DOI   ScienceOn
3 Martinson, Indrek, L. J. Curtis: Nuclear Instruments andMethods in Physics Research B 235 (2005) 17   DOI   ScienceOn
4 R. F. Egerton: Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd ed. (Plenum Press New York, 1996)
5 G. Ruthemann: Naturwissenschaften 29 (1941) 648   DOI
6 J. Hillier, R. F. Baker: J Appl Phys 15 (1944) 663   DOI
7 N. W. Parker, M. Utlaut, M. S. Isaacson: Optik 51 (1978)333
8 N. W. Parker, M. Utlaut, M. S. Isaacson: Optik 51 (1978) 333
9 J. G. Chen: Surf. Sci. Reports 30 (1997)
10 A. P. Hitchcock, A. T. Wen: E. Ruhl, Chem Phys 147 (1990) 51   DOI   ScienceOn
11 C. Quintana, S. Marco, N. Bonnet, C. Risco, M. L. Gutierrez, A. Guerrero, J. L. Carrascosa, Micron 29 (1998) 297   DOI   ScienceOn
12 C. Quintana, N. Bonnet, S. Marco, 14th International Congress on Electron Microscopy, Cancun (Mexique), 1998, p. 711
13 K. H. Kortje: J Microsc-Oxford 174 (1994) 149   DOI   ScienceOn
14 J. Mayer, U. Eigenthaler, J. M. Plitzko, F. Dettenwanger: Micron 28 (1997) 361   DOI   ScienceOn
15 J. M. Martin, B. Vacher, L. Ponsonnet, V. Dupuis: Ultramicroscopy 65 (1996) 229   DOI   ScienceOn
16 J. M. Plitzko: J. Mayer, Ultramicroscopy 78 (1999) 207   DOI   ScienceOn
17 K. Okada, K. Kimoto, S. Komatsu, S. Matsumoto: J Appl Physb (2003) 3120
18 J. L. Lavergne, J. M. Martin, M. Belin: Microsc Microanal M 3 (1992) 517   DOI   ScienceOn
19 L. Ponsonnet, B. Vacher, J. M. Martin: Thin Solid Films 324 (1998) 170   DOI   ScienceOn
20 C. Jeanguillaume, P. Trebbia, C. Colliex: Ultramicroscopy 3 (1978) 237   DOI   ScienceOn
21 T. C. Rojas, M. J. Sayagues, A. Caballero, Y. Koltypin, A. Gedanken: L. Ponsonnet, B. Vacher, J.M. Martin, A. Fernandez, J Mater Chem 10 (2000) 715   DOI   ScienceOn