Surface Morphology, Microstructure and Mechanical Properties of Thin Ag Films |
Shugurov, Artur
(Institute of Strength Physics and Materials Science SB RAS)
Panin, Alexey (Institute of Strength Physics and Materials Science SB RAS) Chun, Hui-Gon (ReMM, School of Materials Science and Engineering, University of Ulsan) Oskomov, Konstantin (Institute of High Current Electronics SB RAS, Tomsk, Russia) |
1 |
/
DOI |
2 |
/
DOI ScienceOn |
3 |
/
DOI ScienceOn |
4 |
/
DOI |
5 |
/
DOI |
6 |
/
|
7 |
/
DOI |
8 |
/
DOI ScienceOn |
9 |
/
DOI |
10 |
/
DOI ScienceOn |
11 |
/
DOI ScienceOn |