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Development of Certified Reference Materials for Specific Surface Area  

Choi, Byung Il (Korea Research Institute of Standard and Science)
Kim, Jong Chul (Korea Research Institute of Standard and Science)
Kim, Taeyoung (Korea Research Institute of Standard and Science)
Nham, Hyunsoo (Korea Research Institute of Standard and Science)
Kwon, Su Yong (Korea Research Institute of Standard and Science)
Publication Information
Analytical Science and Technology / v.18, no.1, 2005 , pp. 74-84 More about this Journal
Abstract
Understandings of adsorption characteristic of interface are very important in several advanced materials processes, related to NT and BT technology. Volumetric gas adsorption method, suitable for absolute measurements, is regarded as the standardized measurement technique for specific surface area. In order to verify the reliability of commercial equipments, certified reference materials (called CRM) of specific surface area are developed and evaluated its uncertainty factors by standard equipment which has traceability to SI units. Specific surface areas of developed materials are $10.72{\pm}0.46m^2g^{-1}$ for silicon nitride powders and $149.50{\pm}3.44m^2g^{-1}$ for alumina. These disseminations of CRMs would result in improved reliability chains in industrial processes, and lead eventually to contribution to productivity improvement, quality management, safety evaluation, and possibly to new material development.
Keywords
Specific Surface Area; Certified Reference Materials; Gas Adsorption; BET; Volumetric Method;
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