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Design of Asynchronous Nonvolatile Memory Module using Self-diagnosis Function  

Shin, Woohyeon (Semiconductor Engineering of Cheongju University)
Yang, Oh (Semiconductor Engineering of Cheongju University)
Yeon, Jun Sang (WOOJIN Industrial System Co. Ltd.)
Publication Information
Journal of the Semiconductor & Display Technology / v.21, no.1, 2022 , pp. 85-90 More about this Journal
Abstract
In this paper, an asynchronous nonvolatile memory module using a self-diagnosis function was designed. For the system to work, a lot of data must be input/output, and memory that can be stored is required. The volatile memory is fast, but data is erased without power, and the nonvolatile memory is slow, but data can be stored semi-permanently without power. The non-volatile static random-access memory is designed to solve these memory problems. However, the non-volatile static random-access memory is weak external noise or electrical shock, data can be some error. To solve these data errors, self-diagnosis algorithms were applied to non-volatile static random-access memory using error correction code, cyclic redundancy check 32 and data check sum to increase the reliability and accuracy of data retention. In addition, the possibility of application to an asynchronous non-volatile storage system requiring reliability was suggested.
Keywords
NAND Flash; NVSRAM; Self-diagnosis; ECC Code; CRC32; Data check sum;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
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