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Deep-learning based In-situ Monitoring and Prediction System for the Organic Light Emitting Diode  

Park, Il-Hoo (School of Electrical Engineering, Korea University)
Cho, Hyeran (School of Electrical Engineering, Korea University)
Kim, Gyu-Tae (School of Electrical Engineering, Korea University)
Publication Information
Journal of the Semiconductor & Display Technology / v.19, no.4, 2020 , pp. 126-129 More about this Journal
Abstract
We introduce a lifetime assessment technique using deep learning algorithm with complex electrical parameters such as resistivity, permittivity, impedance parameters as integrated indicators for predicting the degradation of the organic molecules. The evaluation system consists of fully automated in-situ measurement system and multiple layer perceptron learning system with five hidden layers and 1011 perceptra in each layer. Prediction accuracies are calculated and compared depending on the physical feature, learning hyperparameters. 62.5% of full time-series data are used for training and its prediction accuracy is estimated as r-square value of 0.99. Remaining 37.5% of the data are used for testing with prediction accuracy of 0.95. With k-fold cross-validation, the stability to the instantaneous changes in the measured data is also improved.
Keywords
OLED; Organic Material; Degradation; Deep Learning; Machine Learning; Lifetime Assessment;
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Times Cited By KSCI : 4  (Citation Analysis)
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