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Blur Detection through Multinomial Logistic Regression based Adaptive Threshold  

Mahmood, Muhammad Tariq (Korea University of Technology and Education, School of Computer Science and Engineering)
Siddiqui, Shahbaz Ahmed (Korea University of Technology and Education, School of Computer Science and Engineering)
Choi, Young Kyu (Korea University of Technology and Education, School of Computer Science and Engineering)
Publication Information
Journal of the Semiconductor & Display Technology / v.18, no.4, 2019 , pp. 110-115 More about this Journal
Abstract
Blur detection and segmentation play vital role in many computer vision applications. Among various methods, local binary pattern based methods provide reasonable blur detection results. However, in conventional local binary pattern based methods, the blur map is computed by using a fixed threshold irrespective of the type and level of blur. It may not be suitable for images with variations in imaging conditions and blur. In this paper we propose an effective method based on local binary pattern with adaptive threshold for blur detection. The adaptive threshold is computed based on the model learned through the multinomial logistic regression. The performance of the proposed method is evaluated using different datasets. The comparative analysis not only demonstrates the effectiveness of the proposed method but also exhibits it superiority over the existing methods.
Keywords
Blur detection; Multinomial logistic regression; Blur map; Blur Segmentation; Local binary pattern;
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Times Cited By KSCI : 2  (Citation Analysis)
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