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Teresa Oh, "Electrical Characteristics of Thin Film Transistor According to the Schottky Contacts," Korean Journal of Materials Research, Vol.24, pp.135-139, 2014.
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2 |
Jung Whan Ko, Bo Young Jung and Teresa Oh, "Annealing Effect with Various Ambient Conditions of ITO Thin Film", Journal of the Semiconductor & Display Technology, Vol. 14, No. 4.pp. 20-24 (2015)
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3 |
Yoo Duk-yean, Kim Hyoung-ju, Kim Jun-yeong, Jo Jung-yol, "Current Variation in ZnO Thin-Film Transistor under Different Annealing Conditions," Journal of the Semiconductor & Display Technology Vol .13, pp.63-66, No.1, 2014.
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4 |
T. Oh, "Ohmic Contact Effect and Electrical Characteristics of ITO Thin Film Depending on SiOC Insulator" Korean J. Mater. Res. Vol. 25, No. 7 1149-1154 (2015).
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Janotti and C. Van de Walle, "New insights into the role of native point defects in ZnO", J. Cryst. Growth, Vol. 287, pp. 58-65, 2006.
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6 |
T. Oh, Tunneling Phenomenon of amorphous Indium- Gallium-Zinc-Oxide Thin Film Transistors for Flexible Display, EML Vol. 11. pp.853-861 (2015)
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7 |
Jang-Yeon Kwon, Do-Joong Lee and Ki-Bum Kim, Transparent amorphous oxide semiconductor thin film transistor, Electronic Mate. Lett. Vol. 7/1, pp. 1- 11, 2011.
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8 |
T. Oh, Tunneling condition at high Schottky barrier and ambipolar transfer characteristics in zinc oxide semiconductor thin film transistor, Materials Research Bulletin, vol. 77, pp. 1-7 (2016)
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9 |
Meng Yu, Jungyol Jo,"Sputtering Growth of ZnO Thin-Film Transistor Using Zn Target," Journal of the Semiconductor & Display Technology, Vol. 13, pp.35-38 No. 3, 2014.
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10 |
T. Oh and C. K. Choi, Comparison between SiOC Thin Films Fabricated by Using Plasma Enhance Chemical Vapor Deposition and Thin Films by Using Fourier Transform Infrared Spectroscopy. Journal of the Korean Phys. Soc. 56, 1150-1155 (2010).
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11 |
Sungyong Kim and Sangjik Kwon, High Conductive Transparent Electrode of ITO/Ag/i-ZnO by In-Line Magnetron Sputtering Method, Journal of the Semiconductor & Display Technology, Vol. 14, pp.33-36, 2015.
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