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Remote Access and Data Acquisition System for High Voltage Electron Microscopy/
[Ahn, Young-Heon;Kang, Ji-Seoun;Jung, Hyun-Joon;Kim, Hyeong-Seog;Jung, Hyung-Soo;Han, Hyuck;Jeong, Jong-Man;Gu, Jung-Eok;Lee, Sang-Dong;Lee, Jy-Soo;Cho, Kum-Won;Kim, Youn-Joong;Yeom, Heon-Young;]
/ Applied Microscopy
/ 2006
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