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| 1 |
Development of Uncertainty Evaluation Model for Vacuum Measurement Standards
Hong, S.S.;Lim, J.Y.;Shin, Y.H.;
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The Korean Vacuum Society
, v.20, no.5, pp.313-321,
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| 2 |
Improvement of Repeatability during Dielectric Etching by Controlling Upper Electrode Temperature
Shin, Han-Soo;Roh, Yong-Han;Lee, Nae-Eung;
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The Korean Vacuum Society
, v.20, no.5, pp.322-326,
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| 3 |
Plasma Polymerized Styrene for Gate Insulator Application to Pentacene-capacitor
Hwang, M.H.;Son, Y.D.;Woo, I.S.;Basana, B.;Lim, J.S.;Shin, P.K.;
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The Korean Vacuum Society
, v.20, no.5, pp.327-332,
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| 4 |
Effect of Plasma Density on the Tribological Properties of Amorphous Carbon Thin Films
Park, Y.S.;Lee, J.D.;Hong, B.;
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The Korean Vacuum Society
, v.20, no.5, pp.333-338,
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| 5 |
Ohmic Contact of Ti/Au Metals on n-type ZnO Thin Film
Lee, Kyoung-Su;Suh, Joo-Young;Song, Hoo-Young;Kim, Eun-Kyu;
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The Korean Vacuum Society
, v.20, no.5, pp.339-344,
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| 6 |
Simulation Study on the DC/RF Characteristics of MHEMTs
Son, Myung-Sik;
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The Korean Vacuum Society
, v.20, no.5, pp.345-355,
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| 7 |
Effect of the Cu Bottom Layer on the Optical and Electrical Properties of In2O3/Cu Thin Films
Kim, Dae-Il;
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The Korean Vacuum Society
, v.20, no.5, pp.356-360,
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| 8 |
In-situ Monitoring of GaN Epilayers by Spectral Reflectance
Na, Hyun-Seok;
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The Korean Vacuum Society
, v.20, no.5, pp.361-366,
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| 9 |
Proton Irradiated Cz-Si by the Coincidence Doppler Broadening Positron Annihilation Spectroscopy
Lee, K.H.;Lee, C.Y.;
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The Korean Vacuum Society
, v.20, no.5, pp.367-373,
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| 10 |
Effect of Injection Stage of SF6 Gas Incorporation on the Limitation of Carbon Coils Geometries
Kim, Sung-Hoon;
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The Korean Vacuum Society
, v.20, no.5, pp.374-380,
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| 11 |
Fabrication and Optical Property of ZnO/SiO2 Branch Hierarchical Nanostructures
Ko, Y.H.;Kim, M.S.;Yu, J.S.;
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The Korean Vacuum Society
, v.20, no.5, pp.381-386,
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