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| 1 |
SiGe Alloys for Electronic Device Applications
Lee, Seung-Yun;
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The Korean Vacuum Society
, v.20, no.2, pp.77-85,
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| 2 |
The Study on In-situ Diagnosis of Chemical Vapor Deposition Processes
Jeon, Ki-Moon;Shin, Jae-Soo;Lim, Sung-Kyu;Park, Sang-Hyun;Kang, Byoung-Koo;Yune, Jin-Uk;Yun, Ju-Young;Shin, Yong-Hyeon;Kang, Sang-Woo;
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The Korean Vacuum Society
, v.20, no.2, pp.86-92,
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| 3 |
Effect of the Surface Roughness of Electrode on the Charge Injection at the Pentacene/Electrode Interface
Kim, Woo-Young;Jeon, D.;
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The Korean Vacuum Society
, v.20, no.2, pp.93-99,
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| 4 |
Sheet Resistance of Ion Implanted Si(100) at Various Doses, Energies and Beam Currents
Kim, Hyung-In;Jeong, Young-Wan;Lee, Myeung-Hee;Kang, Suk-Tai;
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The Korean Vacuum Society
, v.20, no.2, pp.100-105,
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| 5 |
Real Time Temperature Distribution Measurement of a Microheater by Using Off-Axis Digital Holography
Tserendolgor, D.;Baek, Byung-Joon;Kim, Dae-Suk;
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The Korean Vacuum Society
, v.20, no.2, pp.106-113,
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| 6 |
Observation of Light-Propagation along the Tube of Cold Cathode Fluorescent Lamp
Cho, Y.H.;Jin, D.J.;Kim, J.H.;Han, S.H.;Cho, G.S.;
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The Korean Vacuum Society
, v.20, no.2, pp.114-126,
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| 7 |
Structural Analysis of Ag Agglomeration in Ag-based Ohmic Contact to p-type GaN
Son, J.H.;Song, Y.H.;Lee, J.L.;
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The Korean Vacuum Society
, v.20, no.2, pp.127-134,
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| 8 |
A Study of Be Levels in p-GaSb:Be/GaAs Epitaxial Layers
Noh, S.K.;Kim, J.O.;Lee, S.J.;
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The Korean Vacuum Society
, v.20, no.2, pp.135-140,
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| 9 |
Properties of ZnO:Al Thin Films Deposited by RF Magnetron Sputtering with Various Base Pressure
Kim, D.K.;Kim, H.B.;
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The Korean Vacuum Society
, v.20, no.2, pp.141-145,
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| 10 |
Tape-Type Liquid Leakage Film Sensor
Yu, D.K.;Kim, K.S.;Yub, H.K.;Han, G.H.;Jin, D.J.;Kim, J.H.;Han, S.H.;Cho, G.S.;
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The Korean Vacuum Society
, v.20, no.2, pp.146-154,
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| 11 |
Direct Growth of CNT on Cu Foils for Conductivity Enhancement and Their Field Emission Property Characterization
Kim, J.J.;Lim, S.T.;Kim, G.H.;Jeong, G.H.;
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The Korean Vacuum Society
, v.20, no.2, pp.155-163,
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