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| 1 |
Proton implantation mechanism involved in the fabrication of SOI wafer by ion-cut process
우형주;최한우;김준곤;지영용;
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The Korean Vacuum Society
, v.13, no.1, pp.1-8,
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| 2 |
ARPES 를 이용한 Na/Ge(111)-3×1 표면의 전자구조 연구
Kim, Jeong Won;Kim, Se Hun;Seo, Jae Myeong;
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The Korean Vacuum Society
, v.13, no.1, pp.42-42,
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| 3 |
Chemical and Electrical Properties of Polyimide Thin Flim Fabricated by Ionized Cluster Beam
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The Korean Vacuum Society
, v.13, no.1, pp.43-43,
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| 4 |
Characteristics of perylene OTFT fabricated in UHV
박대식;강성준;김희중;노명근;황정남;
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The Korean Vacuum Society
, v.13, no.1, pp.9-13,
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| 5 |
The defect nature and electrical properties of the electron irradiated  junction diode
엄태종;강승모;김현우;조중열;김계령;이종무;
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The Korean Vacuum Society
, v.13, no.1, pp.14-21,
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| 6 |
Impurity analysis of Ta films using secondary ion mass spectrometry
;;Minoru Isshiki;
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The Korean Vacuum Society
, v.13, no.1, pp.22-28,
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| 7 |
Polycrystalline silicon thin film fabricated on plastic substrates by excimer laser annealing
조세현;이인규;김영훈;문대규;한정인;
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The Korean Vacuum Society
, v.13, no.1, pp.29-33,
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| 8 |
Thermal oxidation effect for sidewall roughness minimization of hot embossing master for polymer optical waveguides
최춘기;정명영;
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The Korean Vacuum Society
, v.13, no.1, pp.34-38,
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| 9 |
Nano-patterning technology using an UV-NIL method
심영석;정준호;손현기;신영재;이응숙;최성욱;김재호;
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The Korean Vacuum Society
, v.13, no.1, pp.39-45,
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