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| 1 |
Conduction Properties of NitAI Ohmic Contacts to AI-implanted p-type 4H-SiC
Joo, Seong-Jae;Song, Jae-Yeol;Kang, In-Ho;Bahng, Wook;Kim, Sang-Cheol;Kim, Nam-Kyun;Lee, Yong-Jae;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.717-723,
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| 2 |
Screen Printed ZnBO Doped (Ba,Sr)TiO3 Thick Film Planner Capacitors
Moon, Sang-Ho;Koh, Jung-Hyuk;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.724-727,
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| 3 |
Simulation of Channel Dimension Dependent Conduction and Charge Distribution Characteristics of Silicon Nanowire Transistors using a Quantum Model
Hwang, Min-Young;Choi, Chang-Yong;Moon, Kyoung-Sook;Koo, Sang-Mo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.728-731,
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| 4 |
Carrier Lifetime Analysis of Proton Irradiated SOl Wafer with Pseudo MOSFET Technology
Jung, Sung-Hoon;Lee, Yong-Hyun;Lee, Jae-Sung;Kwon, Young-Kyu;Bae, Young-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.732-736,
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| 5 |
Mixed-mode Simulation of Switching Characteristics of SiC DMOSFETs
Kang, Min-Seok;Choi, Chang-Yong;Bang, Wook;Kim, Sang-Chul;Kim, Nam-Kyun;Koo, Sang-Mo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.737-740,
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| 6 |
Modeling of Indium Tin Oxide(ITO) Film Deposition Process using Neural Network
Min, Chul-Hong;Park, Sung-Jin;Yoon, Neung-Goo;Kim, Tae-Seon;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.741-746,
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| 7 |
Study on Contact Resistance on the Performance of Oxide Thin Film Transistors
Lee, Jae-Sang;Koo, Sang-Mo;Lee, Sang-Yeol;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.747-750,
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| 8 |
Low Leakage Current Circular AlGaN/GaN Schottky Barrier Diode
Kim, Min-Ki;Lim, Ji-Yong;Choi, Young-Hwan;Kim, Young-Shil;Seok, O-Gyun;Han, Min-Koo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.751-755,
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| 9 |
Investigation on the Micro-photoluminescence of ZnO Thin Films Grown by Pulsed Laser Deposition
Lee, Deuk-Hee;Leem, Jae-Hyeon;Kim, Sang-Sig;Lee, Sang-Yeol;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.756-759,
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| 10 |
Effects of Fe2O3 Addition on Optical and Electrical Properties of MgO Films as a Protective Layer for AC PDPs
Kim, Chang-II;Jeong, Young-Hun;Lee, Young-Jin;Paik, Jong-Hoo;choi, Eun-Ha;Jung, Seok;Kim, Jeong-Seok;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.760-765,
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| 11 |
Phase Transitional Behavior and Piezoelectric Properties of 0.94(Na0.5K0.5NbO3-0.06Ba(Ti0.9Sn0.1)O3 Lead-free Ceramics
Cha, Yu-Joung;Nahm, Sahn;Jeong, Young-Hun;Lee, Young-Jin;Paik, Jong-Hoo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.766-771,
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| 12 |
Characteristics of ITO Thin Films Sputtered on Polycarbonate substrates at Various Pressures by In-line Sputter
Ahn, Min-Hyung;Cho, Eui-Sik;Kwon, Sang-Jik;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.772-775,
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| 13 |
The Study of Opto-electric Properties in EL Device with PMN Dielectric Layer
Kum, Jeong-Hun;Han, Da-Sol;Ahn, Sung-Il;Lee, Seong-Eui;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.776-780,
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| 14 |
Effects of BCP Thickness on the Electrical and Optical Characteristics of Blue Phosphorescent Organic Light Emitting Diodes
Seo, Yu-Seok;Moon, Dae-Gyu;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.781-785,
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| 15 |
A Study on PD Detection Methods for Cast-resin Dry-type Transformers
Park, Chan-Yong;Park, Dae-Won;Choi, Jae-Sung;Kil, Gyung-Suk;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.786-791,
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| 16 |
Electrical and Optical Properties of CdS Thin Film with Different Substrate Temperatures
Park, Jung-Cheul;Lee, Woo-Sik;Chu, Soon-Nam;Cho, Yong-Joon;Jeon, Yong-Woo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.22, no.9, pp.792-797,
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