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| 1 |
Investigation for Multi-bit per Cell on the CSL-NOR Type SONOS Flash Memories
Kim Joo-Yeon;An Ho-Myoung;Lee Myung-Shik;Kim Byung-Cheul;Seo Kwang-Yell;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.193-198,
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| 2 |
Characterization of CdS Thin Films and CdS/CdTe Heterojunction Prepared by Different Techniques
Lee, Jae-Hyeong;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.199-205,
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| 3 |
A Study for Stable End Point Detection in 90 nm WSix/poly-Si Stack-down Gate Etching Process
Ko, Yong-Deuk;Chun, Hui-Gon;Lee, Jing-Hyuk;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.206-211,
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| 4 |
Modified Illumination with a Concentric Circular Grating at the Backside of a Photomask
Oh, Yong-Ho;Go, Chun-Soo;Lim, Sungwoo;Lee, Jai-Cheol;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.212-215,
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| 5 |
Optimal Design of Spiral Inductors on Silicon Substrates for RF ICs
Moon, Yeong-Joo;Choi, Moon-Ho;Na, Kee-Yeol;Kim, Nam-Su;Kim, Yeong-Seuk;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.216-218,
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| 6 |
Polishing Properties by Change of Slurry Temperature in Oxide CMP
Ko, Pil-Ju;Park, Sung-Woo;Kim, Nam-Hoon;Seo, Yong-Jin;Lee, Woo-Sun;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.219-225,
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| 7 |
A Study on Photocatalytic Degradation Properties by Oxygen Partial Pressure for Tio2Thin Films Fabricated by DC Magnetron Sputtering
Jeong, W.J.;Park, J.Y.;Park, G.C.;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.226-230,
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| 8 |
The Fabrication of Micro-electrodes to Analyze the Single-grainboundary of ZnO Varistors and the Analysis of Electrical Properties
So, Soon-Jin;Lim, Keun-Young;Park, Choon-Bae;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.231-236,
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| 9 |
Microstructural and Piezoelectric Properties of Low Temperature Sintering PMN-PZT Ceramics with the Variations of Sintering Times
Yoo, Ju-Hyun;Lee, Chang-Bae;Lee, Sang-Ho;Paik, Dong-Soo;Jeong, Yeong-Ho;Im, In-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.237-242,
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| 10 |
Piezoelectric and Dielectric Characteristics of Low Temperature Sintering PNW-PMN-PZT Ceramics according to CaCO3Addition
Yoo, Ju-Hyun;Lee, Sang-Ho;Lee, Chang-Bae;Song, Hyun-Sun;Chung, Kwang-Hyun;Jeong, Yeong-Ho;Park, Durk-Won;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.243-247,
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| 11 |
Electric Field Strength and Compressive Stress Effects on the Displacement of Multilayered Ceramic Actuators
Song, Jae-Sung;Jeong, Soon-Jong;Kim, In-Sung;Min, Bok-Ki;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.248-252,
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| 12 |
Characteristics of CrOx Thin-films for High Precision Resistors
Seo, Jeong-Hwan;Noh, Sang-Soo;Lee, Eung-Ahn;Kim, Kwang-ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.253-258,
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| 13 |
Work Function Changes on MgO Protective Layer after O2plasma Treatment from Ion-induced Secondary Electron Emission Coefficient
Jeong, Jae-Cheon;Yu, SeGi;Cho, Jaewon;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.259-263,
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| 14 |
2.2-inch QCIF+ a-Si TFT-LCD using Integrated Row Driver Circuits
Yun, Y.J.;Han, S.W.;Jung, C.G.;Chung, K.H.;Kim, H.S.;Kim, S.Y.;Lim, Y.J.;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.264-268,
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| 15 |
Variance of Initial Fault Current Limiting Instant in Flux-lock Type SFCL
Park, Chung-Ryul;Lim, Sung-Hun;Park, Hyoung-Min;Choi, Hyo-Sang;Han, Byoung-Sung;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.269-275,
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| 16 |
Fabrication and Characteristics of Magnetic Tunneling Transistors using the Amorphous n-Type Si Films
Lee, Sang-Suk;Lee, Jin-Yong;Hwang, Do-Guwn;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.18, no.3, pp.276-283,
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