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| 1 |
An On-line Monitoring and Control System for Semiconductor Manufacturing Process Utilizing Fuzzy Rule Extraction
Chen, Jen-Cheng;Chang, Ming;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.20, no.2, pp.3-11,
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| 2 |
Device Characterization Using Support Vector Machines
Lin, David;Muniz, Dan;Wang, Chia-Jiu;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.20, no.2, pp.12-21,
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| 3 |
지능성 발현을 위한 CSVM 프로세서 개발
Wi, Jae-U;Lee, Jong-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.20, no.2, pp.22-32,
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| 4 |
프로브카드 제조기술 동향 및 신경망을 이용한 지능형 프로브 탐침 설계기술
Kim, Tae-Sun;Min, Cheol-Hong;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.20, no.2, pp.33-41,
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