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| 1 |
HVEM Application to Electron Crystallography: Structure Refinement of 
Kim, Jin-Gyu;Kim, Young-Min;Kim, Ji-Soo;Kim, Youn-Joong;
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Korean Society of Microscopy
, v.36, no.spc1, pp.1-7,
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| 2 |
Dynamical Instability of Interfaces
Saka, H.;Tsukimoto, S.;Sasaki, K.;
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Korean Society of Microscopy
, v.36, no.spc1, pp.9-17,
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| 3 |
In-situ HRTEM Studies of Alumina-Aluminum Solid-Liquid Interfaces
Oh, Sang-Ho;Scheu, Christina;Ruhle, Manfred;
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Korean Society of Microscopy
, v.36, no.spc1, pp.19-24,
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| 4 |
A New Trend of In-situ Electron Microscopy with Ion and Electron Beam Nano-Fabrication
Furuya, Kazuo;Tanaka, Miyoko;
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Korean Society of Microscopy
, v.36, no.spc1, pp.25-33,
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| 5 |
TEM Study on the Growth Characteristics of Self-Assembled InAs/GaAs Quantum Dots
Kim, Hyung-Seok;Suh, Ju-Hyung;Park, Chan-Gyung;Lee, Sang-Jun;Noh, Sam-Gyu;Song, Jin-Dong;Park, Yong-Ju;Lee, Jung-Il;
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Korean Society of Microscopy
, v.36, no.spc1, pp.35-40,
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| 6 |
Atomic Structure Analysis of A ZnO/Pd Interface by Atomic Resolution HVTEM
Saito, Hiromitsu;Ichinose, Hideki;
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Korean Society of Microscopy
, v.36, no.spc1, pp.41-46,
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| 7 |
Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
Kim, Gyeung-Ho;Ahn, Jae-Pyoung;
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Korean Society of Microscopy
, v.36, no.spc1, pp.47-56,
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| 8 |
In-situ Observation of Hydride Stability of Vanadium Alloys in Electron Microscope
Ohnuki, S.;Takase, K.;Yashiki, K.;Hamada, K.;Suda, T.;Watanabe, S.;
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Korean Society of Microscopy
, v.36, no.spc1, pp.57-61,
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| 9 |
Electron Holography of Advanced Nanomaterials
Shindo, D.;Park, H.S.;Kim, J.J.;Oikawa, T.;Tomita, T.;
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Korean Society of Microscopy
, v.36, no.spc1, pp.63-69,
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