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1 |
Electrical Properties of ZPCCT-based Varistor Ceramics
Nahm, Choon-Woo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.105-109,
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2 |
Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs
Zhang, Ying-Ying;Lee, Won-Jae;Zhong, Zhun;Li, Shi-Guang;Jung, Soon-Yen;Lee, Ga-Won;Wang, Jin-Suk;Lee, Hi-Deok;Lim, Sung-Kyu;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.110-114,
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3 |
Impact of Passivation and Reliability for Base-exposed InGaP/GaAs HBTs
Park, Jae-Woo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.115-120,
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4 |
Preparation and Luminescence Properties of PDP Green Phosphors using Polymer Matrix Technique
Jun, Sang-Bae;Lee, Dong-Kyu;Kim, Soo-Jong;Masaki, Takaki;Han, Chung-Hwa;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.121-124,
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5 |
Effects of Intermediate Layer in DLC Thin Film on Al2O3 for Improvement of High Temperature Strength
Ok, Chul-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.125-130,
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6 |
Equivalent-circuit Analysis of ITO/Alq3/Al Organic Light-emitting Diode
Chung, Dong-Hoe;Kim, Tae-Wan;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.131-134,
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7 |
A Study on Electro-optical Characteristics of the UV Aligned FFS Cell on the Organic Layer
Han, Jeong-Min;Ok, Chul-Ho;Hwang, Jeoung-Yeon;Kim, Byoung-Yong;Kang, Dong-Hun;Kim, Jong-Hwan;Kim, Young-Hwan;Han, Jin-Woo;Lee, Sang-Keuk;Seo, Dae-Shik;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.135-138,
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8 |
Copper Phthalocyanine Field-effect Transistor Analysis using an Maxwell-wagner Model
Lee, Ho-Shik;Yang, Seung-Ho;Park, Yong-Pil;Lim, Eun-Ju;Iwamoto, Mitsumasa;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.139-142,
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9 |
A Study on Synthetic Failure-finding Method for Electrical and Thermal Degradation of Polymer Insulator by Surface Discharge
Lee, Kang-Won;Jang, Dong-Uk;Park, Cheol-Hyun;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.8, no.3, pp.143-146,
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