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1 |
Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
Kang Ey-Goo;Lee Dae-Yeon;Lee Chang-Hun;Kim Chang-Hun;Sung Man-Young;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.53-57,
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2 |
ZnO Nanowire-film Hybrid Nanostructure for Oxygen Sensor Applications
Jeong Min-Chang;Oh Byeong-Yun;Myoung Jae-Min;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.58-61,
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3 |
Advanced Pad Conditioner Design for Oxide/Metal CMP
Hwang Tae-Wook;Baldoni Gary;Tanikella Anand;Puthanangady Thomas;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.62-66,
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4 |
Characterization of BST Thin Films using MgO(100) Buffer Layer for Tunable Device
Lee Cheol-In;Kim Kyoung-Tae;Kim Chang-Il;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.67-71,
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5 |
Preparation and Characterization of Screen-printed Lead Zirconate Titanate Thick Films
Lee Sung-Gap;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.72-75,
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6 |
Electrochemical Characteristics of LiMnO2 for Lithium Secondary Battery
Jin Bo;Jun Dae-Kyoo;Gu Hal-Bon;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.76-80,
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7 |
Statistical Modeling of Pretilt Angle Control on the Homogeneous Polyimide Surface as a Function of Rubbing Strength and Baking Temperature
Kang Hee-Jin;Lee Jung-Hwan;Hwang Jeoung-Yeon;Yun Il-Gu;Seo Dae-Shik;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.81-86,
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8 |
Current Limiting Characteristics of Flux-lock Type SFCL according to Inductance Variation
Choi Hyo-Sang;Park Hyoung-Min;Cho Yong-Sun;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.87-89,
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9 |
A Study of On-line Monitoring System for a KEPCO Pumped Storage Generator/Motor
Kim Hee-Dong;Ju Young-Ho;Kim Yong-Joo;Cho Kyu-Bock;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.7, no.2, pp.90-95,
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