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| 1 |
The Analysis of Electrothermal Conductivity Characteristics for SOI(SOS) LIGBT with latch-up
Kim, Je-Yoon;Hong, Seung-Woo;Park, Sang-Won;Sung, Man-Young;Kang, Ey-Goo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.129-132,
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| 2 |
X-ray Sensitivity of Hybrid-type Sensor based on CaWO4-Selenium for Digital X-ray Imager
Park, Ji-Koon;Park, Jang-Yong;Kang, Sang-Sik;Lee, Dong-Gil;Kim, Jae-Hyung;Nam, Sang-Hee;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.133-137,
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| 3 |
Wafer Burn-in Method of SRAM for Multi Chip Package
Kim, Hoo-Sung;Kim, Je-Yoon;Sung, Man-Young;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.138-142,
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| 4 |
Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers
Kim, Suk-Goo;Park, Jea-Gun;Paik, Un-Gyu ;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.143-147,
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| 5 |
An Investigation of Locally Trapped Charge Distribution using the Charge Pumping Method in the Two-bit SONOS Cell
An, Ho-Myoung;Lee, Myung-Shik;Seo, Kwang-Yell;Kim, Byung-Cheul;Kim, Joo-Yeon;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.148-152,
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| 6 |
Electrical and Optical Properties of ITO Films Sputtered by RF -bias Voltage and In-Sn Alloy Target
Kim, Hyun-Hoo;Shin, Sung-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.153-157,
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| 7 |
Fabrication of BSCCO Films using CVD Process
Lee, Sang-Heon;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.158-160,
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| 8 |
Analysis of Ozone Concentration by TD and Q-mass Method
Lee, Dong-Gyu;Lee, Joon-Ung;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.5, no.4, pp.161-165,
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