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| 1 |
Anti-Reflection Properties of In-Situ Doped Spin-On Film
U. Gangopadhyay;Kim, Kyung-Hae;Park, J.H.;S.K. Dhungel;D. Mangalaraj;J. Yi;H. Saha;Kim, D.W.;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.1-4,
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| 2 |
The Fracture Distribution in ITO Coating with Compressive Bending Stress on Polymer Substrates
Lee, Sang-Keuk;Lee, Joon-Ung;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.5-8,
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| 3 |
Experiment of Drifting Mobilities of Holes and Electrons in Stabilized a-Se Film
Kang, Sang-Sik;Park, Ji-Koon;Park, Jang-Yong;Kim, Jae-Hyung;Nam, Sang-Hee;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.9-12,
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| 4 |
Photoluminescence of ZnGa2O4-xMx:Mn2+ (M=S, Se) Thin Films
Yi, Soung-Soo;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.13-16,
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| 5 |
Improvement of Commercial Silicon Solar Cells with N+-P-N+ Structure using Halogenic Oxide Passivation
K. Chakrabarty;D. Mangalaraj;Kim, Kyung-Hae;Park, J.H.;J. Yi;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.17-20,
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| 6 |
Polarizers and Splitters on the Base of Multi-layer Systems
L.I. Berezhinsky;Park, Dae-Yong;Sung, Chang-Min;Park, Byung-Sun;Kwon, Kwang-Ho;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.21-27,
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| 7 |
A Study on the Corrosion Effects by Addition of Complexing Agent in the Copper CMP Process
Kim, Sang-Yong;Kim, Nam-Hoon;Kim, In-Pyo;Chang, Eui-Goo;Seo, Yong-Jin;Chung, Hun-Sang;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.28-31,
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| 8 |
Characteristics of Trap in the Thin Silicon Oxides with Nano Structure
Kang, C.S.;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.4, no.6, pp.32-37,
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