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| 1 |
Measurements of Developed Patterns by Direct writing of Electron Beam on Different Materials underneath PMMA
June, Won-Chae;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.1-7,
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| 2 |
Electron Microscope Analyses of Self-aligned HgTe Nanocrystallites Induced by Controlled Precipitation Technique
Lee, Man-Jong;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.8-13,
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| 3 |
Reduction of Plasma Process Induced Damage during HDP IMD Deposition
Kim, Sang-Yung;Lee, Woo-Sun;Seo, Yong-Jin;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.14-17,
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| 4 |
Anomalous Subthreshold Characteristics of Shallow Trench-Isolated Submicron NMOSFET with Capped p-TEOS/SiN
Lee, Hyung J.;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.18-20,
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| 5 |
Nd1+XBa2-XCu3O7-δ Bulk Superconductor by Zone-melt Process
Soh, Dea-Wha;Guo, Fan-Zhan;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.21-24,
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| 6 |
Microstructural, Dielectric and Electrical Properties of(Pb,La,Ce)TiO3 Ceramics for High Frequency Ceramic Resonator as a function of MnO2 Addition
Yoo, Ju-Hyung;Oh, Dong-On;Park, Chang-Yub;Kim, Ji-Hong;Lee, Sung-Ill;Ryu, Sung-Lim;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.25-28,
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| 7 |
Preparation and Characterization of β-C3N4 in Presence of Seed Carbon Nitride Films Deposited by Laser-Electric Discharge Method
Kim, J.I.;Zorov, N.B.;Burdina, K.P;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.29-33,
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| 8 |
Efficiency Estimation of Toxicity Free Eire Resistance Cable
Yoon, Hun-Ju;Hon, Jin-Woong;
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The Korean Institute of Electrical and Electronic Material Engineers
, v.3, no.3, pp.34-38,
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