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| 1 |
A 1.62/2.7/5.4 Gbps Clock and Data Recovery Circuit for DisplayPort 1.2 with a single VCO
Seo, Jin-Cheol;Moon, Yong-Hwan;Seo, Joon-Hyup;Jang, Jae-Young;An, Taek-Joon;Kang, Jin-Ku;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.185-192,
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| 2 |
A 5-20 GHz 5-Bit True Time Delay Circuit in 0.18 ㎛ CMOS Technology
Choi, Jae Young;Cho, Moon-Kyu;Baek, Donghyun;Kim, Jeong-Geun;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.193-197,
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| 3 |
A Small-Area Solenoid Inductor Based Digitally Controlled Oscillator
Park, Hyung-Gu;Kim, SoYoung;Lee, Kang-Yoon;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.198-206,
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| 4 |
Low Phase Noise LC-VCO with Active Source Degeneration
Nguyen, D.B. Yen;Ko, Young-Hun;Yun, Seok-Ju;Han, Seok-Kyun;Lee, Sang-Gug;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.207-212,
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| 5 |
A Unified Channel Thermal Noise Model for Short Channel MOS Transistors
Yu, Sang Dae;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.213-223,
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| 6 |
Device and Circuit Level Performance Comparison of Tunnel FET Architectures and Impact of Heterogeneous Gate Dielectric
Narang, Rakhi;Saxena, Manoj;Gupta, R.S.;Gupta, Mridula;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.224-236,
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| 7 |
A Continuous Regional Current-Voltage Model for Short-channel Double-gate MOSFETs
Zhu, Zhaomin;Yan, Dawei;Xu, Guoqing;Peng, Yong;Gu, Xiaofeng;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.237-244,
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| 8 |
The Optimal Design of Junctionless Transistors with Double-Gate Structure for reducing the Effect of Band-to-Band Tunneling
Wu, Meile;Jin, Xiaoshi;Kwon, Hyuck-In;Chuai, Rongyan;Liu, Xi;Lee, Jong-Ho;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.245-251,
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| 9 |
Improvement of Thermal Stability of Nickel Silicide Using Co-sputtering of Ni and Ti for Nano-Scale CMOS Technology
Li, Meng;Oh, Sung-Kwen;Shin, Hong-Sik;Lee, Hi-Deok;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.252-258,
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| 10 |
Efficient Multi-site Testing Using ATE Channel Sharing
Eom, Kyoung-Woon;Han, Dong-Kwan;Lee, Yong;Kim, Hak-Song;Kang, Sungho;
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The Institute of Electronics and Information Engineers
, v.13, no.3, pp.259-262,
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