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1 Impact Analysis of NBTI/PBTI on SRAM VMIN and Design Techniques for Improved SRAM VMIN
Kim, Tony Tae-Hyoung;Kong, Zhi Hui; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.87-97,
2 A Range-Scaled 13b 100 MS/s 0.13 um CMOS SHA-Free ADC Based on a Single Reference
Hwang, Dong-Hyun;Song, Jung-Eun;Nam, Sang-Pil;Kim, Hyo-Jin;An, Tai-Ji;Kim, Kwang-Soo;Lee, Seung-Hoon; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.98-107,
3 A 12-b Asynchronous SAR Type ADC for Bio Signal Detection
Lim, Shin-Il;Kim, Jin Woo;Yoon, Kwang-Sub;Lee, Sangmin; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.108-113,
4 Electromagnetic Susceptibility Analysis of I/O Buffers Using the Bulk Current Injection Method
Kwak, SangKeun;Nah, Wansoo;Kim, SoYoung; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.114-126,
5 Investigation of Empty Space in Nanoscale Double Gate (ESDG) MOSFET for High Speed Digital Circuit Applications
Kumari, Vandana;Saxena, Manoj;Gupta, R.S.;Gupta, Mridula; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.127-138,
6 An Accurate Gate-level Stress Estimation for NBTI
Han, Sangwoo;Lee, Junho;Kim, Byung-Su;Kim, Juho; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.139-144,
7 A Low Power, Small Area Cyclic Time-to-Digital Converter in All-Digital PLL for DVB-S2 Application
Kim, Hongjin;Kim, SoYoung;Lee, Kang-Yoon; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.145-151,
8 A 0.5-2.0 GHz Dual-Loop SAR-controlled Duty-Cycle Corrector Using a Mixed Search Algorithm
Han, Sangwoo;Kim, Jongsun; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.152-156,
9 A novel hardware design for SIFT generation with reduced memory requirement
Kim, Eung Sup;Lee, Hyuk-Jae; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.157-169,
10 Fractional-N Frequency Synthesis: Overview and Practical Aspects with FIR-Embedded Design
Rhee, Woogeun;Xu, Ni;Zhou, Bo;Wang, Zhihua; / The Institute of Electronics and Information Engineers , v.13, no.2, pp.170-183,