Browse > Article List
학술지 정보
Current Applied Physics  

논문
1 Charge exchange for medium energy He and Ne ions in a large-angle collision at solid surfaces
Kido, Yoshiaki;Semba, Syohei;Hoshino, Yasushi; / Korean Physical Society , v.3, no.1, pp.3-7,
2 High-resolution depth profiling of ultrashallow boron implants in silicon using high-resolution RBS
Kimura, Kenji;Oota, Yukitoshi;Nakajima, Kaoru;Buyuklimanli, Temel H.; / Korean Physical Society , v.3, no.1, pp.9-11,
3 Femtosecond electron dynamics on solid surfaces probed by low energy ion scattering and stimulated desorption of secondary ions
Souda, Ryutaro; / Korean Physical Society , v.3, no.1, pp.13-17,
4 Structural studies at metallic surfaces and interfaces using MEIS
Woodruff, D.P.;Munoz-Marquez, M.A.; / Korean Physical Society , v.3, no.1, pp.19-24,
5 Reactive ion scattering study of physisorbed adsorbates: experiment and theory
Lahaye, R.J.W.E.;Kang, H.; / Korean Physical Society , v.3, no.1, pp.25-29,
6 Ion-induced emission microscopies
Doyle, B.L.;Walsh, D.S.;Vizkelethy, G.;Rossi, P.;McDaniel, F.D.;Schenkel, T.;McDonald, J.;Hamza, A.V.; / Korean Physical Society , v.3, no.1, pp.31-34,
7 The role of basic energy-loss processes in layer-resolved surface investigations with ions
Schiwietz, G.;Grande, P.L.; / Korean Physical Society , v.3, no.1, pp.35-37,
8 Ion beam as a probe to study the behavior of hydrogen on silicon surfaces
Oura, Kenjiro;Katayama, Mitsuhiro; / Korean Physical Society , v.3, no.1, pp.39-44,
9 Interface strain profiling in ultrathin $SiO_{2}$ gate oxides with medium energy ion scattering spectroscopy
Moon, D.W.;Lee, H.I.; / Korean Physical Society , v.3, no.1, pp.45-49,
10 Depth resolution and narrow nuclear resonance profiling
Vickridge, I.C.; / Korean Physical Society , v.3, no.1, pp.51-55,
11 Structure analysis of the Si(111)-)-$\sqrt{3}\;{\times}\;\sqrt{3}$-Sb surface by means of CAICISS combined with LEED–AES–RBS techniques
Kishi, N.;Morita, K.; / Korean Physical Society , v.3, no.1, pp.57-60,
12 Sputter damage in Si surface by low energy $Ar^{+}$ ion bombardment
Shin, Hye-Chung;Oh, Suhk-Kun;Kang, Hee-Jae;Lee, Hyung-Ik;Moon, Dae-Won; / Korean Physical Society , v.3, no.1, pp.61-64,
13 Exploring surface processes by coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysis
Katayama, Mitsuhiro; / Korean Physical Society , v.3, no.1, pp.65-69,
14 A Cu(1 1 1)(${\surd}3\;{\times}\;{\surd}3$R$30^{\circ}$-Sb structure by impact collision ion-scattering spectroscopy
Umezawa, K.;Takaoka, H.;Hirayama, S.;Nakanishi, S.;Gibson, W.M.; / Korean Physical Society , v.3, no.1, pp.71-74,
15 Depth profiling of ultrathin films using medium energy ion scattering
Kim, Joon-Kon;Lennard, W.N.;McNorgan, C.P.;Hendriks, J.;Mitchell, I.V.;Landheer, D.;Gredley, J.; / Korean Physical Society , v.3, no.1, pp.75-82,
16 Atomic structure of Cs grown on Si(0 0 1)($2\;{\times}\;1$) surfaceby coaxial impact collision ion scattering spectroscopy
Kim, J.Y.;Park, J.Y.;Seo, J.H.;Whang, C.N.;Kim, S.S.;Choi, D.S.;Kang, H.J.;Chae, K.H.; / Korean Physical Society , v.3, no.1, pp.83-88,
17 Aspects of layer-by-layer composition analysis using MEIS
Bailey, P.;Noakes, T.C.Q.;Baddeley, C.J.;Laan, G. van der;Brown, D.;Quinn, P.D.;Woodruff, D.P.; / Korean Physical Society , v.3, no.1, pp.89-92,