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1 |
Analyses for RF parameters of Tunneling FETs
Kang, In-Man;
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The Institute of Electronics and Information Engineers
, v.49, no.4, pp.1-6,
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2 |
A noble Sample-and-Hold Circuit using A Micro-Inductor To Improve The Contrast Resolution of X-ray CMOS Image Sensors
Lee, Dae-Hee;Cho, Gyu-Seong;Kang, Dong-Uk;Kim, Myung-Soo;Cho, Min-Sik;Yoo, Hyun-Jun;Kim, Ye-Won;
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The Institute of Electronics and Information Engineers
, v.49, no.4, pp.7-14,
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3 |
Evaluation Toolkit for K-FPGA Fabric Architectures
Kim, Kyo-Sun;
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The Institute of Electronics and Information Engineers
, v.49, no.4, pp.15-25,
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4 |
Fault Test Algorithm for MLC NAND-type Flash Memory
Jang, Gi-Ung;Hwang, Phil-Joo;Chang, Hoon;
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The Institute of Electronics and Information Engineers
, v.49, no.4, pp.26-33,
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5 |
A Design of Wide Input Range Multi-mode Rectifier for Wireless Power Transfer System
Choi, Young-Su;Lee, Kang-Yoon;
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The Institute of Electronics and Information Engineers
, v.49, no.4, pp.34-42,
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