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1 Reliability Characteristics of Class-E Power Amplifier using Class-F Driving Circuit
Choi, Jin-Ho; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.287-290,
2 Chemical Mechanical Polishing Characteristics of BTO Films using $TiO_2$- and $BaTiO_3$-Mixed Abrasive Slurry (MAS)
Lee, Woo-Sun;Seo, Yong-Jin; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.291-296,
3 The Characteristics of Chalcogenide $Ge_1Se_1Te_2$ Thin Film for Nonvolatile Phase Change Memory Device
Lee, Jae-Min;Chung, Hong-Bay; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.297-301,
4 Development of The Standard Current Transformer with Wide Ratio Error and Its Application
Kwon, Sung-Won;Jung, Jae-Kap;Lee, Sang-Hwa;Kim, Mun-Seog;Kim, Myung-Soo; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.302-307,
5 A Comparative Study of The PD Pattern Analysis Based on PRPD and CAPD for The Diagnosis of Gas Insulated Transformer
Jung, Seung-Yong;Koo, Ja-Yoon; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.308-312,
6 On-Site Evaluation Technique of Linearity for Ratio Error and Phase Angle Error of Current Transformer Comparison Measurement Equipment
Jung, Jae-Kap;Kwon, Sung-Won;Lee, Sang-Hwa;Kang, Jeon-Hong;Kim, Myung-Soo; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.313-316,
7 Development of The Accurate Potential Transformer with Wide Ratio Error and Its Application
Kwon, Sung-Won;Jung, Jae-Kap;Lee, Sang-Hwa;Kim, Myung-Soo; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.317-322,
8 Effective Ozone Generation Utilizing a Slit Barrier
Moon, Jae-Duk;Jung, Jae-Seung; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.323-327,
9 Effects of Electric and Magnetic Fields to Seed Germination and Its Early Growth
Moon, Jae-Duk;Kyon, Nam-Yul; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.328-333,
10 FVTD-LTS Method for Electromagnetic Field Analysis by Dielectric with large Permittivity
Yoon, Kwang-Yeol;Chai, Yong-Yoong; / The Korean Institute of Electrical Engineers , v.55, no.6, pp.334-338,