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1 |
Study on Electrochemical Property of Self-Assembled Viologen Monolayers Using Electrochemical Quartz Crystal Microbalance (EQCM) Method
Lee, Dong-Yun;Park, Sang-Hyun;Park, Jae-Chul;Kwon, Young-Soo;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.107-110,
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2 |
Study of Accelerated Soft Error Rate for Cell Characteristics on Static RAM
Gong, Myeong-Kook;Wang, Jin-Suk;Kim, Do-Woo;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.111-115,
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3 |
Chemical Mechanical Polishing Characteristics of BTO Thin Film for Vertical Sidewall Patterning of High-Density Memory Capacitor
Ko, Pil-Ju;Park, Sung-Woo;Lee, Kang-Yeon;Lee, Woo-Sun;Seo, Yong-Jin;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.116-121,
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4 |
A Study on the UV Degradation Characteristics of FRP by Plasma Surface Modification
Hwang, Myung-Hwan;Lim, Kyung-Bum;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.122-126,
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5 |
UHF Partial Discharge Measurement Technology using a Dual Bands Methods to have the Frequency Characteristics in GIS
Yi, Sang-Hwa;Sun, Jong-Ho;Kang, Dong-Sik;Kim, Kwang-Hwa;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.127-133,
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6 |
Measurement of Ratio Error/Phase Angle Error of Potential Transformer using High Voltage Capacitance Bridge and Uncertainty Analysis
Kwon, Sung-Won;Lee, Sang-Hwa;Kim, Myung-Soo;Jung, Jae-Kap;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.134-141,
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7 |
Solution of the Inverse Electromagnetic Scattering Problem for Cylindrical Objects by Using the Resonance Scattering Ttheory
Jung, Yong-Hwa;Jeon, Sang-Bong;Ahn, Chang-Hoi;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.142-148,
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8 |
Micromirrors Driven by Detached Piezoelectric Microactuators For Low-voltage and Wide-angle Rotation
Kim, Sung-Jin;Jin, Young-Hyun;Lee, Won-Chul;Nam, Hyo-Jin;Bu, Jong-Uk;Cho, Young-Ho;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.149-155,
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9 |
The Electron Temperature and Density Properties of Mixed Gases in ICP Lighting System : (Ne:Xe, Ne:Ar)
Lee, Jong-Chan;Choi, Yong-Sung;Park, Dae-Hee;Choi, Gi-Seung;
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The Korean Institute of Electrical Engineers
, v.55, no.3, pp.156-160,
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