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| 1 |
Low Resistivity Ohmic Ni/Si/Ni Contacts to N-Type 4H-SiC
Kim C. K.;Yang S. J.;Cho N. I.;Yoo H. J.;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.495-499,
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| 2 |
CMOS Logic Circuits with Lower Subthreshold Leakage Current
Song Sang-Hun;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.500-504,
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| 3 |
Influence of Substrate Temperature of SCT Thin Film by RF Sputtering Method
Kim Jin-Sa;Oh Yong-Cheol;Cho Choon-Nam;Lee Dong-Gyu;Shin Cheol-Gi;Kim Chung-Hyeok;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.505-509,
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| 4 |
A Study of The Voltage Transfer Function Dependent On Input Conditions For An N-Input NAND Gate
Kim In-Mo;Song Sang-Hun;Kim Soo-Won;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.510-514,
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| 5 |
A Study on the Partial Discharge Pattern Recognition by Use of SOM Algorithm
Kim Jeong-Tae;Lee Ho-Keun;Lim Yoon Seok;Kim Ji-Hong;Koo Ja-Yoon;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.515-522,
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| 6 |
Degradation Diagnosis of Insulation Paper Using CO and  Gases in Oil Immersed Transformers
Sun Jong-Ho;Yi Sang-Hwa;Kim Kwang-Hwa;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.523-529,
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| 7 |
Frequency-Time Analysis(Partition-FFT) for Tracking Detection
Jee S. W.;Lee S. H.;Kim Ch. N.;Lee C. H.;Lee K. S.;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.530-538,
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| 8 |
Fast Calculation of Capacitance Matrix for Strip-Line Crossings and Other Interconnects
Srinivasan Jegannathan;Lee Dong-Jun;Shim Duk-Sun;Yang Cheol-Kwan;Kim Hyung-Kyu;Kim Hyeong-Seok;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.539-545,
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| 9 |
The Fabrication Processes for the Planarization of Sacrificial Layers over Hollow Structures
Yoon Yong-Seop;Bae Ki-Deok;Choi Hyung;Jun Chan-Bong;Ro Kwang-Choon;
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The Korean Institute of Electrical Engineers
, v.53, no.10, pp.546-550,
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