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1 |
A Design of CMOS VCO Using Bandgap Voltage Reference
최진호;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.425-430,
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2 |
Design and Application of Electric Field Sensor for Measuring PD Signals in High Voltage Equipments
이강원;강성화;임기조;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.431-435,
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3 |
Fabrication and Properties of SCT Thin Film by RF Sputtering Method
김진사;김충혁;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.436-440,
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4 |
Chemical Mechanical Polishing Characteristics with Different Slurry and Pad
서용진;정소영;김상용;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.441-446,
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5 |
A Study on MgF/CeO AR Coating of Mono-Crystalline Silicon Solar Cell
유진수;이재형;이준신;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.447-450,
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6 |
Electrical Characteristics of Oxide Layer Due to High Temperature Diffusion Process
홍능표;홍진웅;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.451-457,
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7 |
A Electrical Characteristics of Disk-type Piezotransformer with Electrode Ratio of Driving and Generating Part
이종필;채홍인;정수현;홍진웅;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.458-463,
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8 |
Capacitance-Voltage Characteristics in the Double Layers of SiO/SiN
Hong, Nung-Pyo;Hong, Jin-Woong;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.464-468,
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9 |
Measurement Device of Resistive Leakage Current for Arrester Deterioration Diagnosis
길경석;한주섭;김정배;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.469-475,
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10 |
The Measurement of Three-Dimensional Temporal Behavior According to the Pressure in the Plasma Display Panel
최훈영;이석현;이승걸;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.476-480,
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11 |
Characteristics and Signal Analysis of Fiber-optic Sensor for Detecting Ultrasonic Waves Generated by Discharge in Insulation Oil
이상훈;송현직;이광식;김달우;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.481-486,
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12 |
Piezoelectric-Actuated Polydimethylsiloxane(PDMS) Micropump with Diffusers
김진호;김영호;김용상;
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The Korean Institute of Electrical Engineers
, v.52, no.10, pp.487-491,
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