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| 1 |
The Doping Concentration and Physical Properties Measurement of Silicon Wafer Using Terahertz Wave
Park, Sung Hyeon;Oh, Gyung Hwan;Kim, Hak Sung;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.1-6,
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| 2 |
Measurement of Absolute Displacement-Amplitude of Ultrasonic Wave Using Piezo-Electric Detection Method
Park, Seong-Hyun;Kim, Jongbeom;Jhang, Kyung-Young;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.7-12,
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| 3 |
Reconstructing Flaw Image Using Dataset of Full Matrix Capture Technique
Lee, Tae-Hun;Kim, Yong-Sik;Lee, Jeong-Seok;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.13-20,
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| 4 |
Study on Characteristics of Eddy Current Array Coil Operated in Transmit-Receive Mode and Surface Inspection Using This Probe
Lee, Tae-Hun;Jee, Dong-Hyun;Cho, Chan-Hee;Kim, In-Chul;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.21-28,
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| 5 |
Development of Nondestructive System for Detecting the Cracks in KTX Brake Disk Using Rayleigh Wave
Kim, Min Soo;Yeom, Yun Taek;Park, Jin-Hyun;Song, Sung Jing;Kim, Hak Joon;Kwon, Sung Duck;Lee, Ho Yong;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.29-36,
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| 6 |
Study on Electrical Impedance Matching for Broadband Ultrasonic Transducer
Kim, Geonwoo;Kim, Ki-Bok;Baek, Kwang Sae;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.37-43,
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| 7 |
Principle and Applications of Induction Infrared Thermography
Kim, Wontae;
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The Korean Society for Nondestructive Testing
, v.37, no.1, pp.44-49,
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