전기전자학회논문지 (Journal of IKEEE)

  • 제28권1호
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  • Pages.116-122
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  • 2024
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  • 1226-7244(pISSN)
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  • 2288-243X(eISSN)
한국전기전자학회 (Institute of Korean Electrical and Electronics Engineers)
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차량용 온칩 버스의 데이터 무결성을 위한 종단간 에러 정정 코드(e2eECC)의 설계 및 구현

Design and Implementation of e2eECC for Automotive On-Chip Bus Data Integrity

  • Eunbae Gil (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University ) ;
  • Chan Park (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University ) ;
  • Juho Kim (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University ) ;
  • Joonho Chung (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University ) ;
  • Joosock Lee (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University ) ;
  • Seongsoo Lee (School of Electronic Engineering and Department of Intelligent Semiconductor, Soongsil University )
  • 투고 : 2024.03.05
  • 심사 : 2024.03.22
  • 발행 : 2024.03.31
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초록

AMBA AHB-Lite 버스는 저전력 및 경제성 측면에서 SoC에 널리 사용되는 온칩 버스 프로토콜이다. 하지만 이 프로토콜은 종단간 데이터 무결성을 위한 에러 검출 및 정정이 불가능하다. 이로 인해 자동차와 같이 열악한 환경에서 동작하는 경우에 데이터 변질과 시스템 불안정을 일으킬 수 있다. 이러한 문제를 해결하기 위해 본 논문에서는 AMBA AHB-Lite 버스에 SEC-DED(Single Error Correction-Double Error Detection)를 적용하는 방법을 제안한다. 이는 전송 중 발생하는 데이터 에러를 실시간으로 감지하고 정정하여 종단간 데이터 무결성을 강화한다. 시뮬레이션 결과, 에러가 일어나도 실시간으로 이를 감지하고 정정하여 차량용 온칩 버스에서 종단간 데이터 무결성을 강화하는 것을 확인하였다.

AMBA AHB-Lite bus is widely used in on-chip bus protocol for low-power and cost-effective SoC. However, it lacks built-in error detection and correction for end-to-end data integrity. This can lead to data corruption and system instability, particularly in harsh environments like automotive applications. To mitigate this problem, this paper proposes the application of SEC-DED (Single Error Correction-Double Error Detection) to AMBA AHB-Lite bus. It aims not only to detect errors in real-time but also to correct them, thereby enhancing end-to-end data integrity. Simulation results demonstrate real-time error detection and correction when errors occur, which bolsters end-to-end data integrity of automotive on-chip bus.

키워드

과제정보

This work was supported by the R&D Program of the Ministry of Trade, Industry, and Energy (MOTIE) and Korea Evaluation Institute of Industrial Technology (KEIT). (RS-2022-00154973, RS-2023-00232192). It was also supported by MOTIE and Korea Institute for Advancement of Technology (KIAT) (P0012451). The authors wish to thank IC Design Education Center (IDEC) for CAD support.

참고문헌

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