Korean Journal of Optics and Photonics (한국광학회지)

Optical Society of Korea (한국광학회)
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Measurement of the Thickness and Refractive Index of a Thin Film Using a Double-slit Experiment

이중 슬릿 회절 실험을 이용한 박막의 두께와 굴절률 측정

  • Received : 2022.03.07
  • Accepted : 2022.07.27
  • Published : 2022.08.25
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Abstract

We measured the thickness and refractive index of a thin film using a double-slit diffraction experiment. The amount of phase step in the transmitted light generated by the thin film on the transparent substrate was measured by analyzing the diffraction pattern from the double slits. Experiments were conducted not only in air but also in distilled water, to determine thickness and refractive index simultaneously. To verify the validity of this method, we compared our values for thickness and refractive index to those measured using the well-established waveguide-coupling method. The suggested method is expected to be applied as a new method to simultaneously measure the thickness and refractive index of thin films, along with existing methods.

본 연구에서는 이중 슬릿 회절 실험을 이용하여 박막의 두께와 굴절률을 측정하는 실험을 수행하였다. 투명 기판 위에 입혀진 박막이 만드는 투과광의 위상 단층의 크기를 이중 슬릿을 통과하여 나타나는 회절 패턴을 분석하여 측정하였다. 이로부터 두께와 굴절률을 동시에 결정하기 위해 공기와 증류수 속에서 각각 한 번씩 실험을 수행하였다. 이 방법의 유효함을 확인하기 위해 도파로 결합법으로 측정한 두께와 굴절률과 비교하였다. 본 연구에서 제안한 측정법은 기존의 선행 연구들과 더불어 박막의 두께와 굴절률을 동시에 측정할 수 있는 새로운 방법으로 응용될 수 있을 것으로 기대된다.

Keywords

Acknowledgement

본 연구는 2021학년도 부산대학교 교내학술연구비 지원으로 수행되었다.

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