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Design of 4-Layer PCB Considering EMC for Automotive Bluetooth Speaker

차량용 블루투스 스피커를 위한 EMC를 고려한 4층 PCB 설계

  • Received : 2021.10.05
  • Accepted : 2021.11.23
  • Published : 2021.12.31

Abstract

This paper proposes an EMC-aware PCB design method to reduce electromagnetic emission, where trace length and teturn path of critical signal are shortened by changing chip location and trace layout on the PCB, while additional filters or decoupling capacitors are not required. In the proposed method, signal velocity is calculated for various signals on the PCB. Critical signal with the fastest signal velocity is determined and its return path is shortened as much as possible by placing chip location and trace routing first. Return path of critical signal should be carefully designed not to have discontinuity. Power plane and ground plane should be carefully designed not to be divided, since these planes are the reference of return path. The proposed method was applied to automotive directional Bluetooth speaker which failed to pass CISPR 32 and CISPR 25 EMC tests. Its PCB was redesigned based on the proposed method and it easily passed the EMC tests. The proposed method is useful to EMC-sensitive electronic equipments.

본 논문에서는 전자파 방출을 줄이기 위해 필터나 디커플링 캐패시터를 사용하는 대신에 PCB 내의 칩 배치, 배선 모양 등을 변경하여 위험신호의 배선 길이와 귀환경로를 짧게 하는 EMC 고려 PCB 설계 기법을 제안하였다. 제안하는 기법에서는 PCB 상의 여러 가지 신호에 대해 신호속도를 계산하고, 신호속도가 가장 높은 위험신호에 대해 선로를 가능한 짧게 하도록 가장 먼저 칩의 위치를 선정하고 배선도 가장 먼저 수행해야 한다. 또 위험신호의 귀환경로에 불연속이 발생하지 않도록 설계하며 귀환경로의 기준이 되는 전원판과 접지판이 분할되어 있지 않도록 한다. CISPR-32, CISPR-25 등의 전자파 적합성 시험을 통과하지 못했던 차량용 블루투스 지향성 스피커에 이 기법을 적용하여 PCB를 재설계한 후 EMC 측정을 수행하였더니 해당 전자파 적합성 시험을 수월하게 통과할 수 있었다. 제안하는 기법은 EMC 특성이 중요한 전자기기에 유용하게 쓰일 수 있다.

Keywords

Acknowledgement

This work was supported by the R&D Program of the Ministry of Trande, Industry, and Energy (MOTIE) (20008417) and Korea Evaluation Institute of Industrial Technology (KEIT). This work was also supported by the MOTIE (Ministry of Trade, Industry & Energy) (10080649) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device.

References

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