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네오디뮴 영구자석을 이용한 컨베이어벨트 구동형 미세칩 포집장치의 성능 평가

Performance Evaluation of Microchip Removal Device Rotating by Conveyor Belt with Neodymium Permanent Magnet

  • 최성윤 (경남대학교 대학원) ;
  • 왕준형 (한국전기연구원 공정혁신시뮬레이션센터) ;
  • 왕덕현 (경남대학교 기계공학부)
  • 투고 : 2020.11.17
  • 심사 : 2020.12.19
  • 발행 : 2021.01.31

초록

Fine chips generated by machining have an impact on machine failure and quality of machined products, it is necessary to remove the chips, so the microchip collection and removal device by rotating conveyor belt with neodymium permanent magnets was developed. In this research, to solve the problem for reducing the existing microchips in the tank, a micro-chip removal device by rotating conveyor belt with neodymium permanent magnets developed. In the development of micro-chip removal device, 3D CATIA modeling was used, and the flow analysis and the electromagnetic force analysis were performed with COMSOL Multiphysics program. To evaluate the performance of the prototypes produced, design of experiments (DOE) is used to obtain the effect of neodymium conveyor movement speed on chip removal for the ANOVA analysis of recovered powders. An experiment was conducted to investigate the effect of the conveyor feed rate on the chip removal performance in detail. As a result of the experiment, it was confirmed that the slower the feeding speed of the fine chip removing device, the more efficient the chip removal.

키워드

참고문헌

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