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Millimeter-wave diffraction-loss model based on over-rooftop propagation measurements

  • Kim, Kyung-Won (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Kim, Myung-Don (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Lee, Juyul (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Park, Jae-Joon (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Yoon, Young Keun (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Chong, Young Jun (Telecommunication and Media Research Laboratory, Electronics and Telecommunications Research Institute)
  • Received : 2019.09.06
  • Accepted : 2020.01.08
  • Published : 2020.12.14
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Abstract

Measuring the diffraction loss for high frequencies, long distances, and large diffraction angles is difficult because of the high path loss. Securing a well-controlled environment to avoid reflected waves also makes long-range diffraction measurements challenging. Thus, the prediction of diffraction loss at millimeter-wave frequency bands relies on theoretical models, such as the knife-edge diffraction (KED) and geometrical theory of diffraction (GTD) models; however, these models produce different diffraction losses even under the same environment. Our observations revealed that the KED model underestimated the diffraction loss in a large Fresnel-Kirchhoff diffraction parameter environment. We collected power-delay profiles when millimeter waves propagated over a building rooftop at millimeter-wave frequency bands and calculated the diffraction losses from the measurements while eliminating the multipath effects. Comparisons between the measurements and the KED and GTD diffraction-loss models are shown. Based on the measurements, an approximation model is also proposed that provides a simple method for calculating the diffraction loss using geometrical parameters.

Keywords

References

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