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Characterization of alpha-Ga2O3 epilayers grown on cone-shape patterned sapphire substrate by halide vapor phase epitaxy

원뿔 형태의 patterned sapphire substrate 위에 성장한 α-Ga2O3의 특성분석

  • Son, Hoki (Korea Institute of Ceramic Engineering & Technology) ;
  • Choi, Ye-Ji (Korea Institute of Ceramic Engineering & Technology) ;
  • Lee, Young-Jin (Korea Institute of Ceramic Engineering & Technology) ;
  • Kim, Jin-Ho (Korea Institute of Ceramic Engineering & Technology) ;
  • Kim, Sun Woog (Korea Institute of Ceramic Engineering & Technology) ;
  • Ra, Yong-Ho (Korea Institute of Ceramic Engineering & Technology) ;
  • Lim, Tae-Young (Korea Institute of Ceramic Engineering & Technology) ;
  • Hwang, Jonghee (Korea Institute of Ceramic Engineering & Technology) ;
  • Jeon, Dae-Woo (Korea Institute of Ceramic Engineering & Technology)
  • Received : 2019.07.29
  • Accepted : 2019.08.12
  • Published : 2019.08.31

Abstract

In this study, we demonstrated a characterization of ${\alpha}-Ga_2O_3$ grown on a cone-shape patterned sapphire substrate by using the halide vapor phase epitaxy. An ${\alpha}-Ga_2O_3$ was grown on different size of PSS and c-plane sapphire substrate for comparison to confirm the effect of PSS. In addition, growth time of ${\alpha}-Ga_2O_3$ was gradually increased to confirm growth mechanism of ${\alpha}-Ga_2O_3$ grown on the PSS. A growth temperature was changed to $470-550^{\circ}C$. It can be analyzed growth conditions and mechanisms on the cone-shape PSS, resulting in a significant decrease in the FWHM value of an asymmetric plane (10-14) of ${\alpha}-Ga_2O_3$, due to lateral growth that occurs during the growth process.

본 연구에서는 halide vapor phase epitaxy 성장법을 이용하여 원뿔 형태의 패턴이 주기적으로 형성된 patterned sapphire substrate(PSS) 위에 ${\alpha}-Ga_2O_3$를 성장하고 그 특성에 변화에 대해 분석하였다. PSS의 패턴의 유무에 따른 영향을 알아보기 위해 c-plane 사파이어 기판과 원뿔의 크기가 다른 두 개의 PSS 위에 ${\alpha}-Ga_2O_3$를 성장하여 비교 분석하였다. 또한 PSS 위에 성장된 ${\alpha}-Ga_2O_3$의 성장과정을 알아보기 위해 점차 성장 시간을 증가해가며 관찰하였고 성장 온도를 $470-550^{\circ}C$까지 변화해가며 성장하였다. 이를 통해 원뿔 형태의 패턴이 형성된 PSS 위에서의 최적 성장 조건과 그 성장 mechanism에 대해 분석이 가능하였고 그 결과로 성장과정에서 발생하는 수평 성장에 의해 ${\alpha}-Ga_2O_3$의 비대칭면인 (10-14) 반치폭 값을 크게 감소시킬 수 있었다.

Keywords

References

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