Journal of the Korea Academia-Industrial cooperation Society (한국산학기술학회논문지)

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Analyze of I-V Characteristics and Amorphous Sturcture by XRD Patterns

XRD 패턴에 의한 비정질구조와 I-V 특성분석

  • Oh, Teresa (Division of Semiconductor Engineering, Cheongju University)
  • Received : 2019.04.24
  • Accepted : 2019.07.05
  • Published : 2019.07.31
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Abstract

A thinner film has superior electrical properties and a better amorphous structure. Amorphous structures can be effective in improving conductivity through a depletion effect. Research is needed on the Schottky contact, where potential barriers are formed, as a way to identify these characteristics. $SiO_2/SnO_2$ thin films were prepared to examine the amorphous structure and Schottky contact, $SiO_2$ thin films were prepared using Ar = 20 sccm. $SnO_2$ thin films were deposited using mixed gas with a flow rate of argon and oxygen at 20 sccm, and $SnO_2$ thin films were added by magnetron sputtering and treated at $100^{\circ}C$ and $150^{\circ}C$. To identify the conditions under which the amorphous structure was constructed, the XRD patterns were investigated and C-V and I-V measurements were taken to make Al electrodes and perform electrical analysis. The depletion layer was formed by the recombination of electrons and holes through the heat treatment process. $SiO_2/SnO_2$ thin films confirmed that the pores were well formed when heat treated at $100^{\circ}C$ and an electric current was applied over the micro area. An amorphous $SiO_2/SnO_2$ thin film with heat treatment at $100^{\circ}C$ showed no reflection at $33^{\circ}\;2{\theta}$ in the XRD pattern, and a reflection at $44^{\circ}2\;{\theta}$. The macroscopic view (-30 V

박막이 얇아질수록 전기적인 특성이 좋아지려면 비정질구조가 유리하다. 비정질구조는 케리어가 공핍되는 특징을 이용하여 전도성을 높이는데 효과가 있을 수 있다. 이러한 특성을 확인하는 방법으로 전위장벽이 형성되는 쇼키접합에 대한 연구가 필요하다. 비정질구조와 쇼키접합에 대하여 조사하기 위하여 $SiO_2/SnO_2$ 박막을 준비하였으며, $SiO_2$ 박막은 Ar=20 sccm 만들고 $SnO_2$ 박막은 아르곤과 산소의 유량을 각각 20 sccm으로 혼합가스를 사용하였으며, 마그네트론 스퍼터링 방법으로 $SnO_2$의을 증착하고 $100^{\circ}C$와 $150^{\circ}C$에서 열처리를 하였다. 비정질구조가 만들어지는 조건을 알아보기 위하여 XRD 패턴을 조사하고 C-V, I-V 측정을 실시하여 Al 전극을 만들고 전기적인 분석을 실시하였다. 공핍층은 열처리과정을 통하여 전자와 홀의 재결합으로 형성되는데 $SiO_2/SnO_2$ 박막은 $100^{\circ}C$에서 열처리를 한 경우 공핍층이 잘 형성이 되었으며, 미시영역에서는 전기적으로 전류가 크게 작용하는 것을 확인하였다. $100^{\circ}C$에서 열처리를 한 비정질의 $SiO_2/SnO_2$ 박막은 XRD 패턴에서 $33^{\circ}$에서는 픽이 나타나지 않았으며, $44^{\circ}$에서는 픽이 생겼다. 쇼키접합에 의해서 거시적(-30V<전압<30V)으로는 절연체 특성이 보였으나 미시적(-5V<전압<5V)으로는 전도성이 나타났다. 케리어가 부족한 공핍층에서의 전도는 확산전류에 의하여 전도가 이루어진다. 미소영역에서 동작하는 소자인 경우에는 공핍효과에 의한 쇼키접합이 전류의 발생과 전도에 유리하다는 것을 확인하였다.

Keywords

SHGSCZ_2019_v20n7_16_f0001.png 이미지

Fig. 1. X-ray diffraction pottern in a long range of SiO2/SnO2 thin films with various annealing temperature prepared with mixed gases of Ar=20 sccm and O2=20 sccm.

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Fig. 2. X-ray diffraction pottern near 44° of SiO2/SnO2 thin films with various annealing temperature prepared with mixed gases of Ar=20 sccm and O2=20 sccm.

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Fig. 3. Current–voltage characteristics in a long range of SiO2/SnO2 thin films with various annealing temperature.

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Fig. 4. Current–voltage characteristics in a short range of SiO2/SnO2 thin films with various annealing temperature.

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Fig. 5. Contact properties of SiO2/SnO2 thin films with various annealing temperature.

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Fig. 6. Capacitances of SiO2/SnO2 thin films with various annealing temperature.

References

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