Fig. 1. Schematic diagram of the apparatus for electrical conductivity and the Seebeck coefficient measurements. 1.Specimen, 2.Silicon rubber, 3.Voltmeter, 4.DC current source, 5.Thermocouple, 6.Alumina tube, 7.Gas inlet, 8.Gas outlet, 9.Air inlet, and 10.Air outlet.
Fig. 2. XRD patterns of n-type β-SiC powder and products obtained by pyrolyzing PCS at various temperatures for 3h under N2.
Fig. 3. SEM micrographs of the polished surface of specimen S. (a) low-magnification, (b) high-magnification
Fig. 4. Temperature dependence of the Seebeck coefficient.
Fig. 5. SEM micrographs of the fracture surface of specimens. (a) specimen S1, (b) specimen S2
Fig. 6. Temperature dependence of electrical conductivity.
Fig. 7. Temperature dependence of the power factor.
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