Fig. 1. Cross-sectional SEM image of [(Ni0.3Mn0.7)1-xCux]3O4 (x=0.18) thin film annealed at 380℃ for 5 h.
Fig. 2. Surface FE-SEM image of [(Ni0.3Mn0.7)1-xCux]3O4(x=0.22) thin film annealed at 380℃ for 5 h.
Fig. 3. FT-IR spectra of [(Ni0.3Mn0.7)1-xCux]3O4 thin films annealed at 380℃ for 5 h.
Fig. 4. XPS spectra of (a) Mn 2p3/2 and (b) Cu 2p3/2 signals of [(Ni0.3Mn0.7)1-xCux]3O4 (x=0.18) thin film annealed at 380℃ for 5 h.
Fig. 5. Resistivity of [(Ni0.3Mn0.7)1-xCux]3O4 thin films annealed at 380℃ for 5 h.
Fig. 6. Plot of ln(ρ/T) vs 1/T for [(Ni0.3Mn0.7)1-xCux]3O4 thin films annealed at 380℃ for 5 h.
Table 1. XPS results of [(Ni0.3Mn0.7)1-xCux]3O4 thin films annealed at 380℃ for 5 h.
Table 2. The resistivity (ρ), characteristic temperature (T0), activation energy (Ea) and temperature coefficient of resistance (TCR) of [(Ni0.3Mn0.7)1-xCux]3O4 thin films annealed at 380 for 5 h.
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