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System Level ESD Analysis - A Comprehensive Review II on ESD Coupling Analysis Techniques

  • Yousaf, Jawad (Department of Electrical and Computer Engineering, Sungkyunkwan University) ;
  • Lee, Hosang (Department of Electrical and Computer Engineering, Sungkyunkwan University) ;
  • Nah, Wansoo (Department of Electrical and Computer Engineering, Sungkyunkwan University)
  • Received : 2018.01.31
  • Accepted : 2018.04.03
  • Published : 2018.09.01

Abstract

This study presents states-of-the art overview of the system level electrostatic discharge (ESD) analysis and testing. After brief description of ESD compliance standards and ESD coupling mechanisms, the study provides an in-depth review and comparison of the various techniques for the system level ESD coupling analysis using time and frequency domain techniques, full wave electromagnetic modeling and hybrid modeling. The methods used for improving system level ESD testing using troubleshooting and determining the root causes of soft failures, the optimization of ESD testing and the countermeasures to mitigate ESD problems are also discussed.

Keywords

References

  1. C. Duvvury and H. Gossner, System Level ESD Co-Design. United Kingdom: Wiley-IEEE Press, 2015.
  2. P. Intra, A. Yawootti, U. Vinitketkumnuen, and N. Tippayawong, "Investigation on the electrical discharge characteristics of a unipolar corona-wire aerosol charger," Journal of Electrical Engineering and Technology, vol. 6, no. 4, pp. 556-562, 2011. https://doi.org/10.5370/JEET.2011.6.4.556
  3. J. Yousaf, J. Shin, K. Kim, J. Youn, D. Lee, C. Hwang, and W. Nah, "System level esd coupling analysis using coupling transfer impedance function," IEEE Transactions on Electromagnetic Compatibility, vol. 60, no. 2, pp. 310-321, April 2018. https://doi.org/10.1109/TEMC.2017.2707580
  4. J. Yousaf, M. Park, H. Lee, J. Youn, D. Lee, C. Hwang, and W. Nah, "Efficient circuit and an em model of an electrostatic discharge generator," IEEE Transactions on Electromagnetic Compatibility, vol. 60, no. 4, pp. 1078-1086, Aug 2018. https://doi.org/10.1109/TEMC.2017.2787189
  5. K. Wang, D. Pommerenke, J. M. Zhang, and R. Chundru, "The pcb level esd immunity study by using 3 dimension esd scan system," in 2004 International Symposium on Electromagnetic Compatibility, vol. 2, Silicon Valley, CA, USA, Aug 9-13 Aug 2004, pp. 343-348.
  6. G. Muchaidze, J. Koo, Q. Cai, T. Li, L. Han, A. Martwick, K. Wang, J. Min, J. L. Drewniak, and D. Pommerenke, "Susceptibility scanning as a failure analysis tool for system-level electrostatic discharge (esd) problems," IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 268-276, May 2008. https://doi.org/10.1109/TEMC.2008.921059
  7. P. Intra and N. Tippayawong, "Design and evaluation of a high concentration, high penetration unipolar corona ionizer for electrostatic discharge and aerosol charging," Journal of Electrical Engineering & Technology, vol. 8, no. 5, pp. 1175-1181, 2013. https://doi.org/10.5370/JEET.2013.8.5.1175
  8. M. Honda, "Fundamental aspects of esd phenomena and its measurement techniques," IEICE Transactions on Communications, vol. 79, no. 4, pp. 457-461, 1996.
  9. G. C. R. D. Leo and V. M. Primiani, "Esd in electronic equipment: coupling mechanisms and compliance testing," in Industrial Electronics, 2002. ISIE 2002. Proceedings of the 2002 IEEE International Symposium on, vol. 4, L'Aquila, Itlay, 8-11 July 2002, pp. 1382-1385.
  10. S. Caniggia and F. Maradei, "Circuit and numerical modeling of electrostatic discharge generators," IEEE Transactions on Industry Applications, vol. 42, no. 6, pp. 1350-1357, Nov 2006. https://doi.org/10.1109/TIA.2006.882686
  11. D. Pommerenke, J. Fan, and J. Drewniak, "Simulation challenges in system level electrostatic discharge modeling," in 2016 IEEE/ACES International Conference on Wireless Information Technology and Systems (ICWITS) and Applied Computational Electromagnetics (ACES), Honolulu, HI, USA, March 13-18 March 2016, pp. 1-2.
  12. D. C. Smith, "Techniques for investigating the effects of esd on electronic equipment," Journal ofPhysics: Conference Series, vol. 646, no. 1, p. 012036, 2015. https://doi.org/10.1088/1742-6596/646/1/012036
  13. S. V. den Berghe and D. D. Zutter, "Study of {ESD} signal entry through coaxial cable shields," Journal of Electrostatics, vol. 44, no. 34, pp. 135 - 148, 1998. https://doi.org/10.1016/S0304-3886(98)00035-7
  14. Electromagnetic Compatibility (EMC) - Part 4-2: Testing and Measurement Techniques Electrostatic Discharge (ESD) Immunity Test, IEC 61 000-4-2, 2008.
  15. J. Yousaf, J. Shin, H. Lee, J. Youn, D. Lee, C. Hwang, and W. Nah, "Esd triggered current analysis for floating eut with/without shielding of esd generator," in 16th International Symposium on Microwave and Optical Technology, Seoul, South Korea, June 26-28 June 2017, pp. 1.
  16. J. Yousaf, J. Shin, R. Leqian, W. Nah, J. Youn, D. Lee, and C. Hwang, "Effect of esd generator ground strap configuration on esd waveform," in 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, South Korea, June 20-23 June 2017, pp. 121-123.
  17. S. Caniggia and F. Maradei, "Numerical prediction and measurement of esd radiated fields by free-space field sensors," IEEE Transactions on Electromagnetic Compatibility, vol. 49, no. 3, pp. 494-503, Aug 2007. https://doi.org/10.1109/TEMC.2007.902196
  18. J. Zhang, D. G. Beetner, R. Moseley, S. Herrin, and D. Pommerenke, "Modelling electromagnetic field coupling from an esd gun to an ic," in Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on, Aug 2011, pp. 553-558.
  19. M. Park, J. Park, J. Kim, M. Seung, J. Choi, C. Lee, and S. Lee, "Measurement and modeling of system-level esd noise voltages in real mobile products," in 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), vol. 01, Shenzhen, China, May 17-21 May 2016, pp. 632-634.
  20. J. Lee, J. Lim, C. Jo, B. Seol, A. Nandy, T. Li, and D. Pommerenke, "A study of a measurement and simulation method on esd noise causing soft-errors by disturbing signals," in 2011 33rd EOS/ESD Symposium Proceedings, Anaheim, CA, USA, Sept 11-16 Sept. 2011, pp. 1-5.
  21. R. Antong, D. Low, D. Pommerenke, and M. Z. Abdullah, "Prediction of electrostatic discharge (esd) soft error on two-way radio using esd simulation in cst and esd immunity scanning technique," in 36th International Electronics Manufacturing Technology Conference, Johor Bahru, Malaysia, Nov 11-13 Nov. 2014, pp. 1-10.
  22. F. Centola, D. Pommerenke, W. Kai, T. V. Doren, and S. Caniggia, "Esd excitation model for susceptibility study," in 2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No. 03CH37446), vol. 1, Boston, MA, USA, USA, Aug 18-22 Aug. 2003, pp. 58-63.
  23. O. Fujiwara, X. Zhang, and Y. Yamanaka, "Fdtd simulation of electrostatic discharge current by esd testing," IEICE Trans. Commun. , vol. 86, pp. 2390-2396, 2003.
  24. J. s. Lee, D. Pommerenke, J. d. Lim, and B. s. Seol, "Esd field coupling study in relation with pcb gnd and metal chassis," in 2009 20th International Zurich Symposium on Electromagnetic Compatibility, Zurich, Switzerland, Jan 12-16 Jan. 2009, pp. 153-156.
  25. K. H. Kim and Y. Kim, "Systematic analysis methodology for mobile phone's electrostatic discharge soft failures," IEEE Transactions on Electromagnetic Compatibility, vol. 53, no. 3, pp. 611-618, Aug 2011. https://doi.org/10.1109/TEMC.2011.2143719
  26. J. Park, J. Lee, B. Seol, and J. Kim, "Efficient calculation of inductive and capacitive coupling due to electrostatic discharge (esd) using peec method," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 4, pp. 743-753, Aug 2015. https://doi.org/10.1109/TEMC.2015.2424259
  27. F. zur Nieden, S. Scheier, and S. Frei, "Circuit models for esd-generator- cable field coupling configurations based on measurement data," in Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on, Rome, Italy, Sept 17-21 Sept. 2012, pp. 1-6.
  28. T. Yoshida and N. Masui, "A study on system-level esd stress simulation using circuit simulator," in 2013 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), Melbourne, VIC, Australia, May 20-23 May 2013, pp. 1-4.
  29. T. Yoshida, "A study on transmission line modeling method for system- level esd stress simulation," in 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), Taipei, Taiwan, May 26-29 May 2015, pp. 577-580.
  30. Y. Xiu, N. Thomson, R. Mertens, and E. Rosenbaum, "S-parameter based modeling of system-level esd test bed," in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Reno, NV, USA, Sept 27 Sept.-2 Oct. 2015, pp. 1-10.
  31. S. Zhao, C. Zhou, Z. Liang, Z. Qian, and Z. Wang, "Modeling electromagnetic immunity of ldo under esd electromagnetic field coupling," in 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), vol. 01, Shenzhen, China, May 17-21 May 2016, pp. 355-358.
  32. T. Takada, T. Sekine, and H. Asai, "Circuit/electromagnetic hybrid simulation of electrostatic discharge in contact discharge mode," in Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on, Rome, Italy, Sept 17-21 Sept. 2012, pp. 1-6.
  33. B. S. Seol, J. S. Lee, J. D. Lim, H. Lee, H. Park, A. Nandy, and D. Pommerenke, "A circuit model for esd performance analysis of printed circuit boards," in 2008 Electrical Design of Advanced Packaging and Systems Symposium, Seoul, South Korea, Dec 10-12 Dec. 2008, pp. 120-123.
  34. (2007) Industry Council on ESD Target Levels White Paper 1: A Case for Lowering Component Level HBM/MM ESD Specifications and Requirement. [Online]. Available: www.esda.org.
  35. Joint JEDEC/ESDA Standard for Electrostatic Discharge Sensitivity Test Human Body Model (HBM) Component Level, ESDA ANSI/ESDA/JEDEC JS-001-2014, 2014.
  36. (2007) ANSI/ESD S20.20-2007 Protection of Electrical and Electronic Parts, Assemblies and Equipment, ESD Association. [Online]. Available: http://www.esda.org/Documents.html#s2020ANSI/ESDS20.20-2007
  37. Field-Induced Charged-Device Model Test Method for ElectrostaticDischarge-Withstand Thresholds of Microelectronic Components, JEDEC JESD22-C101F, 2013.
  38. (2017) ESD compliance-standards. [Online]. Available: https://www.esdguns.com/content/category/6-esd-compliance-standards
  39. (2010) Industry Council on ESD Target Levels White Paper 2: A Case for Lowering Component Level CDM ESD Specifications and Requirements, Revision 2. [Online]. Available: www.esda.org
  40. (2013) Electrostatic Discharge (ESD) Technology Roadmap Revised March 2013. [Online]. Available: http://www.esda.org/documents/2013ElectrostaticDischargeRoadmap.pdf
  41. Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Component Level, American National Standards Institute (ANSI) ANSI CDM ANSI/ESD S5.3.1-2009, 2009.
  42. Electromagnetic Disturbances for Medical Electrical Equipment, IEC 60 601-1-2, 2014.
  43. J. Lee, J. Lim, B. Seol, Z. Li, and D. Pommerenke, "A novel method for esd soft error analysis on integrated circuits using a tem cell," in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012, Tucson, AZ, USA, Sept 9-14 Sept. 2012, pp. 1-6.
  44. (2014) System level ESD-Expanded. [Online]. Available: https://goo.gl/hJ831N
  45. (2010) Human Body Model (HBM) vs. IEC 6100042 - ON Semiconductor. [Online]. Available: https://www.onsemi.com/pub/Collateral/TND410-D.PDF
  46. Road Vehicles Test Methods for Electrical Disturbances from Electrostatic Discharge, International Standards Organization (ISO) ISO 10 605:2008, 2008.
  47. (2010) Industry Council on ESD Target Levels White Paper 3: System Level ESD Part I: Common Misconceptions and Recommended Basic Approaches. [Online]. Available: www.esda.org
  48. D. Pommerenke and M. Aidam, "Esd: waveform calculation, field and current of human and simulator esd," Journal of Electrostatics, vol. 38, no. 1, pp. 33 - 51, 1996, 1995 EOS/ESD Symposium. https://doi.org/10.1016/S0304-3886(96)00028-9
  49. G. Cerri, R. D. Leo, and V. M. Primiani, "Esd indirect coupling modeling," IEEE Transactions on Electromagnetic Compatibility, vol. 38, no. 3, pp. 274-281, Aug 1996. https://doi.org/10.1109/15.536056
  50. J. S. Lee Iljin, Kim Junghyun, "A g-band frequency doubler using a commercial 150 nm gaas phemt technology," J Electromagn Eng Sci, vol. 17, no. 3, pp. 147-152, 2017. https://doi.org/10.5515/JKIEES.2017.17.3.147
  51. G. Alsharahi, A. M. M. Mostapha, A. Faize, and A. Driouach, "Modelling and simulation resolution of ground-penetrating radar antennas," Journal of Electromagnetic Engineering And Science, vol. 16, no. 3, pp. 182-190, 2016. https://doi.org/10.5515/JKIEES.2016.16.3.182
  52. M. Amin, J. Yousaf, and S. Iqbal, "Single feed circularly polarised omnidirectional bifilar helix antennas with wide axial ratio beamwidth," IET Microwaves, Antennas Propagation, vol. 7, no. 10, pp. 825-830, July 2013. https://doi.org/10.1049/iet-map.2012.0630
  53. K. Wang, D. Pommerenke, R. Chundru, T. V. Doren, F. P. Centola, and J. S. Huang, "Characterization of human metal esd reference discharge event and correlation of generator parameters to failure levels-part ii: correlation of generator parameters to failure levels," IEEE Transactions on Electromagnetic Compatibility, vol. 46, no. 4, pp. 505-511, Nov 2004. https://doi.org/10.1109/TEMC.2004.837688
  54. J. Park, J. Kim, J. Lee, S. Kim, and B. Seol, "Fast calculation of system- level esd noise coupling to a microstrip line using peec method," in 2015 IEEE Electrical Design ofAdvanced Packaging and Systems Symposium (EDAPS), Seoul, South Korea, Dec 14-16 Dec. 2015, pp. 132-135.
  55. J. Koo, Q. Cai, G. Muchaidze, A. Martwick, K. Wang, and D. Pom-merenke, "Frequency-domain measurement method for the analysis of esd generators and coupling," IEEE Transactions on Electromagnetic Compatibility, vol. 49, no. 3, pp. 504-511, Aug 2007. https://doi.org/10.1109/TEMC.2007.902190
  56. F. zur Nieden, S. Frei, and D. Pommerenke, "A combined impedance measurement method for esd generator modeling," in 10th International Symposium on Electromagnetic Compatibility, York, UK, Sept 26-30 Sept. 2011, pp. 476-481.
  57. W. Huang, D. Pommerenke, J. Xiao, D. Liu, J. Min, G. Muchaidze, S. Kwon, and K. H. Kim, "A measurement technique for esd current spreading on a pcb using near field scanning," in 2009 IEEE International Symposium on Electromagnetic Compatibility, Austin, TX, USA, Aug 17-21 Aug. 2009, pp. 18-23.
  58. G. Caccavo, G. Cerri, V. M. Primiani, L. Pierantoni, and P Russo, "Esd field penetration into a populated metallic enclosure a hybrid time- domain approach," IEEE Transactions on Electromagnetic Compatibility, vol. 44, no. 1, pp. 243-249, Feb 2002. https://doi.org/10.1109/15.990731
  59. J. Yousaf, H. Jung, K. Kim, and W. Nah, "Design, analysis, and equivalent circuit modeling of dual band pifa using a stub for performance enhancement," Journal of Electromagnetic Engineering And Science, vol. 16, no. 3, pp. 169-181, 2016. https://doi.org/10.5515/JKIEES.2016.16.3.169
  60. C. Qing, J. Koo, A. Nandy, D. Pommerenke, J. S. Lee, and B. S. Seol, "Advanced full wave esd generator model for system level coupling simulation," in 2008 IEEE International Symposium on Electromagnetic Compatibility, Detroit, MI, USA, Aug 18-22 Aug. 2008, pp. 1-6.
  61. J. Yousaf, J. Shin, H. Lee, W. Nah, J. Youn, D. Lee, and C. Hwang, "Efficient circuit and em model of electrostatic discharge generator," in 2017 IEEE International Symposium on Electromagnetic Compatibility Signal/Power Integrity (EMCSI), Washington, DC, USA, Aug 7-11 Aug. 2017, pp. 164-168.
  62. D. Liu, A. Nandy, D. Pommerenke, S. J. Kwon, and K. H. Kim, "Full wave model for simulating a noiseken esd generator," in 2009 IEEE International Symposium on Electromagnetic Compatibility, Austin, TX, USA, Aug 17-21 Aug. 2009, pp. 334-339.
  63. K. Wang, D. Pommerenke, R. Chundru, T. V. Doren, J. L. Drewniak, and A. Shashindranath, "Numerical modeling of electrostatic discharge generators," IEEE Transactions on Electromagnetic Compatibility, vol. 45, no. 2, pp. 258-271, May 2003. https://doi.org/10.1109/TEMC.2003.810817
  64. D. Johnsson and H. Gossner, "Study of system esd codesign of a realistic mobile board," in EOS/ESD Symposium Proceedings, Anaheim, CA, USA, Sept 11-16 Sept. 2011, pp. 1-10.

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