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Effect of B and W Contents on Hardness of Electroless Co Alloy Thin Films

B와 W의 함량이 무전해 Co 합금 박막의 경도에 미치는 영향 연구

  • Lim, Taeho (Department of Chemical Engineering, Soongsil University) ;
  • Kim, Jae Jeong (Institute of Chemical Process, Seoul National University)
  • 임태호 (숭실대학교 화학공학과) ;
  • 김재정 (서울대학교 화학공정신기술연구소)
  • Received : 2018.09.03
  • Accepted : 2018.10.04
  • Published : 2018.12.01

Abstract

In this study, the electroless deposition of Co-B and Co-W-B alloy thin films was developed and the effect of B and W contents on the hardness of the alloy thin films were investigated. An amorphous Co alloy film was successfully formed by electroless deposition and the contents of B and W in the film were controlled by varying the concentrations of dimethylamine borane and sodium tungstate dihydrate, which were used as a reducing agent and W source, respectively. The hardness of the thin films increased as the contents of B and W were increased because B and W act as impurities suppressing the propagation of dislocation in a film. In addition, it was found that the content of B and W in the Co alloy films can be increased significantly when aeration is not performed. Finally, the hardness of Co-W-B alloy thin film was improved up to 8.9 (${\pm}0.3$) GPa.

본 연구에서는 Co-B, Co-W-B 합금 박막 형성을 위한 무전해 전착법을 고안하고, 이를 통해 형성한 합금 박막의 B과 W의 함량이 박막의 경도에 미치는 영향을 살펴보았다. 무전해 전착을 통해 무정형 상태의 Co 합금 박막을 성공적으로 형성할 수 있었으며, 환원제인 dimethylamine borane과 W의 원료인 sodium tungstate dihydrate의 농도를 조절함으로써 Co 합금 박막 내 혼합되는 B과 W의 함량을 조절하였다. 이를 통해 Co 합금 박막 내 전위(dislocation)의 전파(propagation)를 억제하는 B과 W의 함량이 증가할수록 박막의 경도가 증가함을 확인할 수 있었다. 뿐만 아니라, 무전해 전착 시 포기(aeration)를 수행하지 않을 경우에 포기를 수행한 경우보다 Co 합금 박막 내 B과 W의 함량을 대폭 증가시킬 수 있었고 최종적으로 Co-W-B 합금 박막의 경도를 8.9 (${\pm}0.3$) GPa까지 향상시켰다.

Keywords

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Fig. 4. (a) Electroless deposition rate and (b) surface morphologies of 300-nm-thick Co-W-B alloy films according to the concentration of sodium tungstate dihydrate. Insets in Fig. 4(b) are cross-sectional SEM images of 300-nm-thick Co-W-B alloy films. The concentration of DMAB was 13 mM. The deposition times were 23 min, 30 min, 30 min, and 37 min for 7 mM, 15 mM, 30 mM, and 60 mM Na2WO4·2H2O, respectively.

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Fig. 6. Change in electroless deposition rate with and without aeration. Inset is the surface SEM image of the Co-W-B alloy film deposited at 13 mM DMAB and 7 mM sodium tungstate dihydrate.

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Fig. 7. Changes in (a) B and W contents and (b) Co-W-B alloy film hardness according to aeration status. The concentrations of DMAB and sodium tungstate dihydrate were 13 mM and 7 mM, respectively.

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Fig. 1. (a) Electroless deposition rate and (b) surface morphologies of 300-nm-thick Co-B alloy films according to the concentration of DMAB. Insets in Fig. 1(b) are cross-sectional SEM images of 300-nm-thick Co-B alloy films. The deposition times were 25 min, 23 min, 17 min, and 10 min for 13 mM, 25 mM, 50 mM, and 100 mM DMAB, respectively.

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Fig. 2. (a) X-ray diffraction patterns of the Co-B alloy films deposited at different concentration of DMAB and (b) cross-sectional TEM image of the Co-B alloy film deposited at 13 mM DMAB. Insets in Fig. 2(b) are SAED pattern and magnified image of the dashed box.

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Fig. 3. (a) B content and (b) Co-B alloy film hardness according to the concentration of DMAB.

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Fig. 5. Changes in (a) B and W contents and (b) Co-W-B alloy film hardness according to the concentration of sodium tungstate dihydrate. The concentration of DMAB was 13 mM.

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