DOI QR코드

DOI QR Code

Development of particle focusing device to monitor various low pressure processes

다양한 조건의 저압 공정 모니터링을 위한 입자 집속 장치 개발

  • Kim, Myungjoon (Environmental System Research Division, Korea Institute of Machinery and Materials) ;
  • Kim, Dongbin (School of Mechanical Engineering, Sungkyunkwan University) ;
  • Kang, Sang-Woo (Vacuum Center, Korea Research Institute of Standards and Science) ;
  • Kim, Taesung (School of Mechanical Engineering, Sungkyunkwan University)
  • 김명준 (한국기계연구원 환경시스템연구본부) ;
  • 김동빈 (성균관대학교 기계공학부) ;
  • 강상우 (한국표준과학연구원 진공기술센터) ;
  • 김태성 (성균관대학교 기계공학부)
  • Received : 2017.03.15
  • Accepted : 2017.04.17
  • Published : 2017.06.30

Abstract

As semiconductor process was highly integrated, particle contamination became a major issue. Because particle contamination is related with process yields directly, particles with a diameter larger than half pitch of gate should be controlled. PBMS (Particle beam mass spectrometry) is one of powerful nano particle measurement device. It can measure 5~500 nm particles at ~ 100 mtorr condition in real time by in-situ method. However its usage is restricted to research filed only, due to its big device volume and high price. Therefore aperture changeable aerodynamic lenses (ACALs) which can control particle focusing characteristics by changing its aperture diameter was proposed in this study. Unlike conventional aerodynamic lenses which changes particle focusing efficiency when operating condition is changed, ACALs can maintain particle focusing efficiency. Therefore, it can be used for a multi-monitoring system that connects one PBMS and several process chambers, which greatly improves the commercialization possibility of the PBMS. ACALs was designed based on Stokes number and evaluated by numerical method. Numerical analysis results showed aperture diameter changeable aerodynamic lenses can focus 5 to 100 nm standard particles at 0.1 to 10 torr upstream pressure.

Keywords

References

  1. Choi, H., Kim, H., Yoon, D., Lee, J.W., Kang, B.K., Kim, M.S., Park, J.G., Kwon, S.B., and Kim, T. (2013). Development of CO2 gas cluster cleaning method and its characterization. Microelectronic Engineering, 102, 87-90. https://doi.org/10.1016/j.mee.2011.12.007
  2. Kim, D., Mun, J., Kim, H., Yun, J.Y., Kim, Y.J., Kim, T., Kim, T., and Kang, S.W. (2016). Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum. Review of Scientific Instruments, 87(2), 023304 https://doi.org/10.1063/1.4942247
  3. Kim, T., Suh, S.M., Girshick, S.L., Zachariah, M.R., McMurry, P.H., Rassel, R.M., Shen, Z., and Campbell, S.A. (2002). Particle formation during low-pressure chemical vapor deposition from silane and oxygen: Measurement, modeling, and film properties. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films, 20(2), 413-423. https://doi.org/10.1116/1.1448506
  4. Lee, K. S., Hwang, T. H., Kim, S. H., Kim, S. H., and Lee, D. (2013). Numerical Simulations on Aerodynamic Focusing of Particles in a Wide Size Range of 30 nm-10 ${\mu}m$. Aerosol Science and Technology, 47(9), 1001-1008. https://doi.org/10.1080/02786826.2013.808737
  5. Lee, K. S., Kim, S., and Lee, D. (2009). Aerodynamic focusing of 5-50 nm nanoparticles in air. Journal of Aerosol Science, 40(12), 1010-1018. https://doi.org/10.1016/j.jaerosci.2009.09.004
  6. Liu, P., Ziemann, P. J., Kittelson, D. B., and McMurry, P. H. (1995). Generating Particle Beams of Controlled Dimensions and Divergence: I. Theory of Particle Motion in Aerodynamic Lenses and Nozzle Expansions. Aerosol Science and Technology, 22(3), 293-313. https://doi.org/10.1080/02786829408959748
  7. Miyashita, H., Kikuchi, T., Kawasaki, Y., Katakura, Y., and Ohsako. N. (1999). Particle measurements in vacuum tools by in situ particle monitor. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 17(3), 1066-1070. https://doi.org/10.1116/1.581684
  8. Na, J., Kim, T., Choi, J.B., Kim, Y.J., Shin, Y.H., Yun, J.Y., and Kang, S.W. (2010). Effects of process variables on TiN particle formation during metallorganic chemical vapor deposition. Electrochemical and Solid State Letters, 13(7), H248-H252. https://doi.org/10.1149/1.3418338
  9. O'Hanlon, J.F. (1992). Impact of vacuum equipment contamination on semiconductor yield. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 10(4), 1863-1868. https://doi.org/10.1116/1.577760
  10. Qi, L., McMurry, P. H., Norris, D. J., and Girshick, S. L. (2010). Micropattern Deposition of Colloidal Semiconductor Nanocrystals by Aerodynamic Focusing. Aerosol Science and Technology, 44(1), 55-60. https://doi.org/10.1080/02786820903376876
  11. Schreiner, J., Schild, U., Voigt, C., and Mauersberger, K. (1999). Focusing of Aerosols into a Particle Beam at Pressures from 10 to 150 Torr. Aerosol Science and Technology, 31(5), 373-382. https://doi.org/10.1080/027868299304093
  12. Selwyn, G.S., and Patterson, E.F. (1992). Plasma particulate contamination control. II. Self-cleaning tool design. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 10(4), 1053-1059. https://doi.org/10.1116/1.578201
  13. Semiconductor Industry Association. (2015). International Technology Roadmap for Semiconductors 2015, http://public.itrs.net/Files/2003ITRS/Home2003.htm.
  14. Takahashi, K.M., and Daugherty, J.E. (1996). Current capabilities and limitations of insitu particle monitors in silicon processing equipment. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 14(6), 2983-2993. https://doi.org/10.1116/1.580257
  15. Wang, X., Kruis, F.E., and McMurry, P.H. (2005a). Aerodynamic focusing of nanoparticles: I. Guidelines for designing aerodynamic lenses for nanoparticles. Aerosol Science and Technology, 39(7), 611-623. https://doi.org/10.1080/02786820500181901
  16. Wang, X., Gidwani, A., Girshick, S.L., and McMurry, P.H. (2005b). Aerodynamic focusing of nanoparticles: II. Numerical simulation of particle motion through aerodynamic lenses. Aerosol Science and Technology, 39(7), 624-636. https://doi.org/10.1080/02786820500181950
  17. Wang X., and McMurry, P.H. (2006). A Design Tool for Aerodynamic Lens Systems. Aerosol Science and Technology, 40(5), 320-334. https://doi.org/10.1080/02786820600615063
  18. Ziemann, P. J., Liu, P., Rao, N.P., Kittelson, D.B., and Mcmurry, P.H. (1995). Particle-beam mass-spectrometry of submicron particles charged to saturation in an electron-beam. Journal of Aerosol Science 26(5), 745-756. https://doi.org/10.1016/0021-8502(95)00009-2