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Calibration Examination of Dose Area Product Meters using X-ray

X선을 이용한 면적선량계의 교정 연구

  • Jung, Jae Eun (Department of Radiological Science, Daegu Health College) ;
  • Won, Do-Yeon (Department of Radiological Science, Daegu Health College) ;
  • Jung, Hong-Moon (Department of Radiological Science, Daegu Health College) ;
  • Kweon, Dae Cheol (Department of Radiological Science, College of Health Science, Shinhan University)
  • 정재은 (대구보건대학교 방사선과) ;
  • 정홍문 (대구보건대학교 방사선과) ;
  • 원도연 (대구보건대학교 방사선과) ;
  • 권대철 (신한대학교 보건과학대학 방사선학과)
  • Received : 2017.02.10
  • Accepted : 2017.02.28
  • Published : 2017.02.28

Abstract

We measured the absorbed dose and the area dose using an ionization chamber type of area dose product (DAP) meter and measured the calibration factor in the X-ray examination. In the indirect dose measurement method, the detector was installed in the radiation part of the X-ray equipment, and the measured value was calculated as the dose at the exposure part. The instrument used to calculate the calibration factor was an X-ray equipment (DK-550R / F, DongKang Medical Co., Ltd., Seoul, Korea). The calibration method for the calibration factor was to connect the DAP meter (PD-8100, Toreck Co. Ltd., Japan) to the calibration dosimeter tube voltage of 70 kV, tube current of 500 mA, 0.158 sec. The reference dosimeter used a semiconductor (DOSIMAX plus A, Scanditronix, $Wellh{\ddot{o}}fer$, Germany). After installing the DAP meter on the front of the multi-collimator of the ionization chamber, the calibration factor of the dosimeter was obtained using the reference dosimeter for accurate dose measurement. Experimental exposure values and values from the calibration dosimeter were calculated by multiplying each calibration factor. The calibration factor was calculated as 1.045. In order to calculate the calibration coefficient according to the tube voltage in the ionization type DAP dosimeter, the absorbed dose and the area dose were calculated and the calibration factor was calculated. The corrective area dose was calculated by calculating the calibration factor of the DAP meter.

엑스선을 이용한 방사선검사에서 전리함 방식의 면적선량계를 이용하여 흡수선량과 면적선량을 측정하고, 교정계수를 측정하였다. 간접선량측정법은 엑스선발생장치의 방사부에 검출기를 설치, 측정치를 조사부위에서의 선량으로 산출하였다. 교정계수를 산출하기 위해 사용된 기기는 엑스선 발생장치로 (DK-550R/F, DongKang Medical Co. Ltd., Seoul, Korea)를 이용하였고, 교정계수를 위한 교정방법은 면적선량계와 교정선량계를 연결하고 관전압 70 kV, 관전류 500 mA, 0.158 sec로 79 mAs 조건을 이용하였다. 면적선량계 (PD-8100, Toreck Co. Ltd. Japan)을 이용하였고, 기준선량계는 반도체검출기 (DOSIMAX plus A, Scanditronix, $Wellh{\ddot{o}}fer$, Germany)를 이용하였다. 면적선량계를 전리함의 다중조리개 전면에 설치 후 정확한 선량 측정을 위해 기준선량계를 이용하여 선량계의 교정계수를 구하였다. 실험적으로 노출하여 측정된 값과 교정선량계에서 나온 값에 각각의 교정계수를 곱하여 산출하였다. 교정계수는 1.045로 산출되었다. 전리함 방식의 면적선량계에서 관전압에 따른 교정계수를 산출하기 위해 흡수선량과 면적선량을 구하여 교정상수를 산출하였다. 면적선량계의 교정계수를 구하여 정확한 면적선량을 산출하여야 한다.

Keywords

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