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Triple-gate Tunnel FETs Encapsulated with an Epitaxial Layer for High Current Drivability

  • Lee, Jang Woo (Department of Electronic Engineering, Sogang University) ;
  • Choi, Woo Young (Department of Electronic Engineering, Sogang University)
  • Received : 2016.08.25
  • Accepted : 2017.02.26
  • Published : 2017.04.30

Abstract

The triple-gate tunnel FETs encapsulated with an epitaxial layer (EL TFETs) is proposed to lower the subthreshold swing of the TFETs. Furthermore, the band-to-band tunneling based on the maximum electric-field can occur thanks to the epitaxial layer wrapping the Si fin. The performance and mechanism of the EL TFETs are compared with the previously proposed TFET based on simulation.

Keywords

References

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