JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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NAC Measurement Technique on High Parallelism Probe Card with Protection Resistors

  • Kim, Gyu-Yeol (School of Electronic and Electrical Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Nah, Wansoo (School of Electronic and Electrical Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
  • Received : 2016.02.11
  • Accepted : 2016.07.21
  • Published : 2016.10.30
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Abstract

In this paper, a novel time-domain measurement technique on a high parallelism probe card with protection resistors installed is proposed. The measured signal amplitude decreases when the measurement is performed by Needle Auto Calibration (NAC) probing on a high parallelism probe card with installed resistors. Therefore, the original signals must be carefully reconstructed, and the compensation coefficient, which is related to the number of channel branches and the value of protection resistors, must be introduced. The accuracy of the reconstructed signals is analyzed based on the varying number of channel branches and various protection resistances. The results demonstrate that the proposed technique is appropriate for evaluating the overall signal performance of probe cards with Automatic Test Equipment (ATE), which enhances the efficiency of probe card performance test dramatically.

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